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EE434: ASIC and Digital Systems

EE434: ASIC and Digital Systems

EE434: ASIC and Digital Systems. Final Review 2 Jacob Murray School of EECS, WSU jmurray@eecs.wsu.edu. Structure of the Exam. Seven to eight problems with multiple parts All topics will be almost equally represented Will look similar to layout of sample exam. Overview.

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1.03k views • 87 slides
Digital Testing: Fault Simulation

Digital Testing: Fault Simulation

Digital Testing: Fault Simulation. Fault Simulation. Classical Fault Simulation Modern Fault Simulation for Combinational Circuits Modern Fault Simulation for Synchronous Sequential Circuits Parallel and Distributed Fault Simulation Fault Grading --- Approximate Fault Simulation

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926 views • 39 slides
ECE 753: FAULT-TOLERANT COMPUTING

ECE 753: FAULT-TOLERANT COMPUTING

ECE 753: FAULT-TOLERANT COMPUTING. Kewal K.Saluja Department of Electrical and Computer Engineering Test Generation and Fault Simulation Lectures Set 3. Overview. Introduction Basics of testing Complexity reduction test generation complexity reduction of fault list Fault Simulation

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471 views • 30 slides
Fault Equivalence

Fault Equivalence

Fault Equivalence. Number of fault sites in a Boolean gate circuit is = #PI + #gates + # (fanout branches) Fault equivalence : Two faults f1 and f2 are equivalent if all tests that detect f1 also detect f2.

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732 views • 28 slides
IP Core-based SoC Testing in VPI Environment

IP Core-based SoC Testing in VPI Environment

IP Core-based SoC Testing in VPI Environment. Pedram Riahi Zain Navabi ECE Department, Northeastern University. Contents. Introduction Traditional Approaches Feasibility Methodologies Implementation Future Works. Introduction Core-based SoC Testing Scenario. Core-Level Chip-Level.

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444 views • 27 slides
DUDES: A Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani

DUDES: A Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani

DUDES: A Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani Subhasish Mitra Jo C. Ebergen 1 Marly Roncken 2 Center for Reliable Computing, Stanford University 1 Sun Microsystems Laboratories 2 Intel Corporation. Outline. Motivation and Background

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338 views • 23 slides

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