'Fault models' diaporamas de présentation

Chapter 8

Chapter 8. Memory Testing and Built-In Self-Test. What is this chapter about?. B asic concepts of memory testing and BIST Memory fault models and test algorithms Memory fault simulation and test algorithm generation RAMSES: fault simulator TAGS: test algorithm generator Memory BIST

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ECE 551: Digital System Design & Synthesis

ECE 551: Digital System Design & Synthesis. Lecture Set 10 10.1: Functional & Timing Verification (Separate File) 10.2: Faults & Testing 10.2 Appendix: PODEM Example Slides adapted from ECE 553 Slides by Prof. Kewal Saluja.

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Dependability and real-time

Dependability and real-time. If a system is to produce results within time constraints, it needs to produce results at all! How to justify and measure how well computer systems meet their targets in presence of faults?. Dependable systems. How do things go wrong and why?

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Fault Tolerance

Fault Tolerance. Motivation : Systems need to be much more reliable than their components Use Redundancy : Extra items that can be used to make up for failures Types of Redundancy : Hardware Software Time Information. Fault-Tolerant Scheduling.

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Simulation, Synthesis and Testing of Quantum Circuits

Simulation, Synthesis and Testing of Quantum Circuits. John P. Hayes and Igor L. Markov Advanced Computer Architecture Laboratory EECS Department University of Michigan, Ann Arbor, MI 48109 QuIST PI Meeting, Los Angeles, June 2003. University of Michigan QuIST Project Overview.

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TESTING OF COMBINATIONAL LOGIC CIRCUITS

TESTING OF COMBINATIONAL LOGIC CIRCUITS. DIGITAL LOGIC CIRCUIT TESTING DEFINITIONS TYPICAL DIGITAL CIRCUIT TEST SETUP FAULT MODELS COMBINATIONAL LOGIC CIRCUITS TEST GENERATION EXCLUSIVE-OR METHOD PATH-SENSITIZING METHOD PATH-SESITIZING IN POPULAR GATES PATH-SESITIZING IN A NETWORK

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Design of High Availability Systems and Networks Appendix V alidation

Design of High Availability Systems and Networks Appendix V alidation. Prof. Ravi K. Iyer Center for Reliable and High-Performance Computing Department of Electrical and Computer Engineering and Coordinated Science Laboratory University of Illinois at Urbana-Champaign iyer@crhc.uiuc.edu.

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Fault Modeling & Testing of VLSI Circuits

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The Past and Future of WRTLT

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Calibrating Achievable Design : Technology Extrapolation, the Bookshelf, and Metrics

Calibrating Achievable Design : Technology Extrapolation, the Bookshelf, and Metrics. Theme Summary Cong, Dai, Kahng, Keutzer, Maly. Mission. Enable the understanding of achievable design. Motivations. Provide system-level design with predictable implementation

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Using Fault Model Enforcement (FME) to Improve Availability

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Software-Based Online Detection of Hardware Defects: Mechanisms, Architectura l Support, and Evaluation

Software-Based Online Detection of Hardware Defects: Mechanisms, Architectura l Support, and Evaluation. Kypros Constantinides University of Michigan Onur Mutlu Microsoft Research Todd Austin and Valeria Bertacco University of Michigan. Reliability Challenges of Technology Scaling.

501 views • 25 slides

Manufacture Testing of Digital Circuits

Manufacture Testing of Digital Circuits. Alexander Gnusin. Library. Design Verification. HDL. specification. manual design. RTL Synthesis. netlist. Is the design consistent with the original specification? Is what I think I want what I really want?. logic optimization.

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Algorithm & Tools for Test & Diagnosis

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DFT Technologies for High-Quality Low-Cost Manufacturing Tests

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EECE **** Embedded System Design

EECE **** Embedded System Design. Validation. Introduction (1). Definition: Validation is the process of checking whether or not a certain (possibly partial) design is appropriate for its purpose, meets all constraints and will perform as expected.

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Net Diagnosis using Stuck-at and Transition Fault Models Lixing Zhao* Vishwani D. Agrawal

Net Diagnosis using Stuck-at and Transition Fault Models Lixing Zhao* Vishwani D. Agrawal. Department of Electrical and Computer Engineering Auburn University, AL 36849 USA * Presently with FutureWei Technologies, Inc., Santa Clara, CA 95054 USA. Outline. Motivation Background

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WP3 Modelling & Testing Theory

WP3 Modelling & Testing Theory. Fault Models Jonny Vinter, SP. Fault Models in D3.1. Mutations SW fault models Mutation testing is used for test case assessment and for fault removal before runtime Failure Mode Functions (FMFs)

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Project Overview

Project Overview. Wolfgang Herzner / ARC smart systems. Objectives. To significantly enhance testing and verification of dependable embedded systems by means of automated generation of efficient test cases

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