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ECE 551: Digital System Design & Synthesis

ECE 551: Digital System Design & Synthesis

ECE 551: Digital System Design & Synthesis. Lecture Set 10 10.1: Functional & Timing Verification (Separate File) 10.2: Faults & Testing 10.2 Appendix: PODEM Example Slides adapted from ECE 553 Slides by Prof. Kewal Saluja.

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842 views • 67 slides
TSS@ETS10 Fault Models, Fault Simulation and Test Generation

TSS@ETS10 Fault Models, Fault Simulation and Test Generation

TSS@ETS10 Fault Models, Fault Simulation and Test Generation. Vishwani D. Agrawal Department of ECE, Auburn University Auburn, AL 36849, USA www.ece.auburn.edu/~vagrawal vagrawal@eng.auburn.edu Prague, May 22, 2010, 2:30-6:30PM. Fault Modeling. Why model faults?

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235 views • 23 slides
Lecture 5 Fault Modeling

Lecture 5 Fault Modeling

Lecture 5 Fault Modeling. Why model faults? Some real defects in VLSI and PCB Common fault models Stuck-at faults Single stuck-at faults Fault equivalence Fault dominance and checkpoint theorem Classes of stuck-at faults and multiple faults Transistor faults Summary Review exercise.

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253 views • 22 slides
VLSI Testing Lecture 3: Fault Modeling

VLSI Testing Lecture 3: Fault Modeling

VLSI Testing Lecture 3: Fault Modeling. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, July 25, 2012, 3:00-4:00PM. Contents.

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258 views • 22 slides
VLSI Testing Lecture 3a: Fault Modeling

VLSI Testing Lecture 3a: Fault Modeling

VLSI Testing Lecture 3a: Fault Modeling. Why model faults? Some real defects in VLSI and PCB Common fault models Stuck-at faults Single stuck-at faults Fault equivalence Fault dominance and checkpoint theorem Classes of stuck-at faults and multiple faults Transistor faults Summary.

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213 views • 21 slides
Design for Testability Theory and Practice Lecture 3: Fault Modeling

Design for Testability Theory and Practice Lecture 3: Fault Modeling

Design for Testability Theory and Practice Lecture 3: Fault Modeling. Why model faults? Some real defects in VLSI and PCB Common fault models Stuck-at faults Single stuck-at faults Fault equivalence Fault dominance and checkpoint theorem Classes of stuck-at faults and multiple faults

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221 views • 21 slides
Source Inversion Validation (SIV): Quantifying Uncertainties in Earthquake Source Inversions

Source Inversion Validation (SIV): Quantifying Uncertainties in Earthquake Source Inversions

Source Inversion Validation (SIV): Quantifying Uncertainties in Earthquake Source Inversions. Martin Mai Morgan Page Danijel Schorlemmer. Earthquake rupture models.

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389 views • 17 slides

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