'Finite chip area' diaporamas de présentation

VLSI Testing engr.uconn/~tehrani/teaching/test/index.html

VLSI Testing http://www.engr.uconn.edu/~tehrani/teaching/test/index.html. Objective. Need to understand Types of tests performed at different stages Verification Testing Manufacturing Testing Acceptance testing Automatic Test Equipment (ATE) technology Influences what tests are possible

1.11k views • 41 slides

EE 587 SoC Design & Test

470 views • 30 slides

Testing for Faults, Looking for Defects

Testing for Faults, Looking for Defects. Vishwani D. Agrawal James J. Danaher Professor Department of Electrical and Computer Engineering Auburn University, Auburn, AL 36849 http://www.eng.auburn.edu/~vagrawal vagrawal@eng.auburn.edu IEEE Latin American Test Workshop, March 2011 Keynote

389 views • 24 slides