'Gate work' diaporamas de présentation

? ? ? F90943078 Graduate Institute of Electronics Engineering National Taiwan University

Advanced Multi-Gate Technologies for the Sub-25 nm Regime. ? ? ? F90943078 Graduate Institute of Electronics Engineering National Taiwan University. Conventional Planar Bulk MOSFET. Challenges for Planar Bulk MOSFETs Scaling Gate Leakage Current Packing Density Drive Current

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Representing Hierarchical Mobility in Software Architectures

Representing Hierarchical Mobility in Software Architectures. Fernando J. Barros University of Coimbra Portugal. Introduction. The ability to move components from one hierarchical model to another becomes necessary to support arbitrary changes in software topologies

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