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2001 ITRS Front End Process

2001 ITRS Front End Process. July 18, 2001 San Francisco, CA. FEP Chapter Scope. The scope of the FEP Chapter of the ITRS is to define comprehensive future requirements and identify potential solutions for the key technology areas in front-end-of-line IC wafer fabrication processing.

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833 views • 42 slides

VERY HIGH PERFORMANCE LOGIC

VERY HIGH PERFORMANCE LOGIC. Note. Slides on High-Speed Bipolar and Superconduction not yet available. GaAs Design. GaAs Material Properties. GaAs Material Problems. Favored Device: MESFET. MESFET Operation. I-V Characteristic. Curtice Model. GaAs MESFET Model.

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410 views • 20 slides

PIDS Scope

PIDS Status and Key Issues: 2003 ITRS Peter M. Zeitzoff for PIDS Technology Working Group ITRS Open Meeting July 16, 2003 San Francisco. PIDS = P rocess I ntegration, D evices, and S tructures Main concerns Process integration and full process flows

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370 views • 17 slides

PIDS Summary

ITWG Meeting Tokyo, Japan November 30 - December 1, 2004. Peter M. Zeitzoff US Chair. PIDS Summary. PIDS Summary. Logic With Design: need to further explore leakage and performance requirements Relation between gate and S/D leakage

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233 views • 3 slides

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'High performance logic' diaporamas de présentation

High performance logic - PowerPoint PPT Presentation

2001 ITRS Front End Process

VERY HIGH PERFORMANCE LOGIC

PIDS Scope

PIDS Summary