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THE TESTING APPROACH FOR FPGA LOGIC CELLS

THE TESTING APPROACH FOR FPGA LOGIC CELLS. E. Barei ša, V. Jusas, K. Motiejūnas, R. Š einauskas Kaunas University of Technology LITHUANIA EWDTW'04. Topics. INTRODUCTION THE CIRCUIT TRANSFORMATION TEST PATTERN GENERATION THE EXPERIMENTS CONCLUSIONS. INTRODUCTION.

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Figure 17.6: Examples of typical triangular cantilevers used as standard AFM probes.

Figure 17.1 : Evolution from MEMS to NEMS to molecular structures. Nanostructures may have a total mass of only a few femtograms. In the nanomechanical regime, it is possible to attain extremely high fundamental frequencies approaching those of vibrational molecular modes.

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