'Liquid metal ion source' diaporamas de présentation

Chapter 3. Basic Instrumentation for Nuclear Technology

Chapter 3. Basic Instrumentation for Nuclear Technology. Accelerators Detectors Reactors. Outline of experiment:

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Scanning probe microscopy (SPM) and lithography

Scanning probe microscopy (SPM) and lithography. Atom and particle manipulation by STM and AFM. AFM oxidation of Si or metals. Dip-pen nanolithography (DPN). Resist exposure by STM field emitted electrons. Indentation, scratching, thermal-mechanical patterning.

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Focused ion beam (FIB)

Focused ion beam (FIB). Overview. Ion source and optics. Ion-solid interaction, damage. Scanning ion beam imaging. ECE 730: Fabrication in the nanoscale : principles, technology and applications Instructor: Bo Cui, ECE, University of Waterloo; http://ece.uwaterloo.ca/~bcui/

892 views • 33 slides

Focused ion beam (FIB)

Focused ion beam (FIB). Overview. Ion source and optics. Ion-solid interaction, damage. Scanning ion beam imaging. ECE 730: Fabrication in the nanoscale : principles, technology and applications Instructor: Bo Cui, ECE, University of Waterloo; http://ece.uwaterloo.ca/~bcui/

1.32k views • 31 slides

Liquid metal ion sources

307 views • 10 slides