'Low work function' diaporamas de présentation

Electron-Specimen Interactions

Electron-Specimen Interactions. Primary Signals: Secondary Electrons Backscattered Electrons X-rays. The size and shape of the region of primary excitation can be estimated by carrying out simulations that use Monte Carlo calculations and take into account the composition of the specimen.

569 views • 49 slides

Electron beam lithography (EBL)

Electron beam lithography (EBL). Overview and resolution limit. Electron source (thermionic and field emission). Electron optics (electrostatic and magnetic lens). Aberrations (spherical, chromatic, diffraction, astigmation). EBL systems (raster/vector scan, round/shaped beam).

1.57k views • 47 slides

Electron beam lithography (EBL)

Electron beam lithography (EBL). Overview and resolution limit. Electron source (thermionic and field emission). Electron optics (electrostatic and magnetic lens). Aberrations (spherical, chromatic, diffraction, astigmation). EBL systems (raster/vector scan, round/shaped beam).

1.38k views • 47 slides

439 views • 39 slides

Research of High Gradient Acceleration Technology for Future Accelerators US/Japan cooperation

Research of High Gradient Acceleration Technology for Future Accelerators US/Japan cooperation. 11 March, 2013 Toshi yasu Higo (KEK). US/Japan cooperation is a key for worldwide collaboration. Asian collab . KEK Structure fabrication & test @ Nextef.

393 views • 26 slides

Secondary Electron D etector

Secondary Electron D etector. Ana Zehtabi Oskuie. SEM basics:. The electron beam interaction with near surface specimen atoms will make a signal which results in the SEM image . . Introduction Secondary electron secondary electron detector.

477 views • 18 slides