Measurement stability - PowerPoint PPT Presentation

Next Generation ICT Testing Challenges

IEEE BTW 2008 Workshop September, 2008 Fort Collins, Colorado Presented by: Alan Albee Teradyne ICT Product Manager. Next Generation ICT Testing Challenges. Next Generation ICT Challenges. Changing Technologies, Testing Philosophies, and Economic conditions….

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754 views • 45 slides

Update on Radiation Tests and Plans by SMU

Update on Radiation Tests and Plans by SMU. SOS LOC1 Fiber VCSELs. Tests on the SOS technology. The proposal to evaluate the 0.25 micron SOS technology for radiation tolerant ASIC development has been approved by ATLAS. Summary of our previous test results: Test chip. Gammas test results.

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300 views • 13 slides

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