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ESE535: Electronic Design Automation

ESE535: Electronic Design Automation. Day 15: March 18, 2009 Static Timing Analysis and Multi-Level Speedup. Today. Topological Worst Case not adequate (too conservative) Sensitization Conditions Timed Calculus Delay-justified paths Timed-PODEM Speedup. Compute ASAP schedule

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671 views • 56 slides

TOPIC : D-frontier and PODEM

TOPIC : D-frontier and PODEM. UNIT 3 : Testing and test generation. Module 3.3 Test generation methodology. Introduction. There are various methods of arriving at the vector that can detect the faulty circuit. Out of these methods two methods which we are discussing here are :

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320 views • 13 slides

To Generate a Single Test Vector to detect all/most number of faults in a given set

To Generate a Single Test Vector to detect all/most number of faults in a given set. Project by: Arvind Raghuraman Course Project ELEC 7250. Problem Statement. The Objective of the project is to determine a test vector that could detect all/most number of faults in a given set.

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385 views • 9 slides

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