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ELEC 7770: Advanced VLSI Design Spring 2014 Analog and Radio Frequency (RF) Testing

ELEC 7770: Advanced VLSI Design Spring 2014 Analog and Radio Frequency (RF) Testing

ELEC 7770: Advanced VLSI Design Spring 2014 Analog and Radio Frequency (RF) Testing. Vishwani D. Agrawal James J. Danaher Professor ECE Department, Auburn University Auburn, AL 36849 vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal/COURSE/E7770_Spr14. References.

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895 views • 73 slides
Vishwani D. Agrawal James J. Danaher Professor ECE Department, Auburn University

Vishwani D. Agrawal James J. Danaher Professor ECE Department, Auburn University

ELEC 7770: Advanced VLSI Design Spring 2010 (Also, ELEC 7250 Class on March 11, 2010) Radio Frequency (RF) Testing. Vishwani D. Agrawal James J. Danaher Professor ECE Department, Auburn University Auburn, AL 36849 vagrawal@eng.auburn.edu

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870 views • 73 slides
VLSI Testing Lectures 15 and 16: Radio Frequency (RF) Testing

VLSI Testing Lectures 15 and 16: Radio Frequency (RF) Testing

VLSI Testing Lectures 15 and 16: Radio Frequency (RF) Testing. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal August 7-13, 2010. References.

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830 views • 73 slides
Vishwani D. Agrawal James J. Danaher Professor ECE Department, Auburn University

Vishwani D. Agrawal James J. Danaher Professor ECE Department, Auburn University

ELEC 7770: Advanced VLSI Design Spring 2010 (Also, ELEC 7250 Class on March 11, 2010) Radio Frequency (RF) Testing. Vishwani D. Agrawal James J. Danaher Professor ECE Department, Auburn University Auburn, AL 36849 vagrawal@eng.auburn.edu

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734 views • 73 slides
VLSI Testing Lecture 16: RF Testing I

VLSI Testing Lecture 16: RF Testing I

VLSI Testing Lecture 16: RF Testing I. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, Aug 27, 2013, 2:30-4:30PM. References.

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406 views • 28 slides
VLSI Testing Lecture 16: RF Testing I

VLSI Testing Lecture 16: RF Testing I

VLSI Testing Lecture 16: RF Testing I. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, Aug 27, 2013, 2:30-4:30PM. References.

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294 views • 28 slides

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