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Lecture 24 Design for Testability (DFT): Partial-Scan & Scan Variations

Lecture 24 Design for Testability (DFT): Partial-Scan & Scan Variations

Lecture 24 Design for Testability (DFT): Partial-Scan & Scan Variations. Definition Partial-scan architecture Historical background Cyclic and acyclic structures Partial-scan by cycle-breaking S-graph and MFVS problem Test generation and test statistics Partial vs. full scan

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961 views • 30 slides
Lecture 24 Design for Testability (DFT): Partial-Scan & Scan Variations

Lecture 24 Design for Testability (DFT): Partial-Scan & Scan Variations

Lecture 24 Design for Testability (DFT): Partial-Scan & Scan Variations. Definition Partial-scan architecture Historical background Cyclic and acyclic structures Partial-scan by cycle-breaking S-graph and MFVS problem Test generation and test statistics Partial vs. full scan

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906 views • 30 slides
Synthesis for Test

Synthesis for Test

Synthesis for Test. Virendra Singh Indian Institute of Science Bangalore virendra@computer.org. IEP on Digital System Synthesis @ IIT Kanpur. Testability. Objective Improve Controllability Observability Reduction in sequential depth Elimination of sequential loop.

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368 views • 24 slides
Lecture 13 Sequential Circuit ATPG Time-Frame Expansion

Lecture 13 Sequential Circuit ATPG Time-Frame Expansion

Lecture 13 Sequential Circuit ATPG Time-Frame Expansion. Problem of sequential circuit ATPG Time-frame expansion Nine-valued logic ATPG implementation and drivability Complexity of ATPG Cycle-free and cyclic circuits Asynchronous circuits Summary. Sequential Circuits.

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338 views • 22 slides
Lecture 13 Sequential Circuit ATPG Time-Frame Expansion

Lecture 13 Sequential Circuit ATPG Time-Frame Expansion

Lecture 13 Sequential Circuit ATPG Time-Frame Expansion. Problem of sequential circuit ATPG Time-frame expansion Nine-valued logic ATPG implementation and drivability Complexity of ATPG Cycle-free and cyclic circuits Asynchronous circuits Summary. Sequential Circuits.

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492 views • 22 slides
Sequential Circuit BIST Synthesis using Spectrum and Noise from ATPG Patterns

Sequential Circuit BIST Synthesis using Spectrum and Noise from ATPG Patterns

Sequential Circuit BIST Synthesis using Spectrum and Noise from ATPG Patterns. Nitin Yogi and Vishwani D. Agrawal Auburn University Auburn, Alabama 36849, USA. Outline . Specifying a BIST problem Proposed method Spectral Analysis BIST implementation Results Fault Coverage Area Overhead

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293 views • 17 slides
Sequential Circuit BIST Synthesis using Spectrum and Noise from ATPG Patterns

Sequential Circuit BIST Synthesis using Spectrum and Noise from ATPG Patterns

Sequential Circuit BIST Synthesis using Spectrum and Noise from ATPG Patterns. Nitin Yogi and Vishwani D. Agrawal Auburn University Auburn, Alabama 36849, USA. Outline . Specifying a BIST problem Proposed method Spectral Analysis BIST implementation Results Fault Coverage Area Overhead

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178 views • 17 slides
Synthesis for Test

Synthesis for Test

Synthesis for Test. Virendra Singh Indian Institute of Science Bangalore virendra@computer.org. IEP on Digital System Synthesis @ IIT Kanpur. Testability. Objective Improve Controllability Observability Reduction in sequential depth. Controllability. Primary input. a.

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190 views • 9 slides

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