Tem analysis - PowerPoint PPT Presentation

（ Transmission Electron Microscopy：TEM ）穿透式電子顯微鏡

（ Transmission Electron Microscopy：TEM ）穿透式電子顯微鏡. Advisor: Kuen-Hsien , Wu Student: Jyun -Li, Wu. Outline. Introduction Principle Application Comparison Conclusion Reference. Introduction. Introduction. 1924 Louis de Broglie. 1926 Hans Busch. 1931 Ernst Ruska. 1939. Principle.

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Superlattice Photocathode Damage Marcy Stutzman and the Center for Injectors and Sources

Surface Analysis Goals Which residual gasses limit photocathode lifetime? Why do we have surface charge limit? Why does SCL get worse with photocathode age? Does Be dopant migrate with heat cycles?.

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Tem analysis - PowerPoint PPT Presentation

（ Transmission Electron Microscopy：TEM ） 穿透式電子顯微鏡

Superlattice Photocathode Damage Marcy Stutzman and the Center for Injectors and Sources

（ Transmission Electron Microscopy：TEM ）穿透式電子顯微鏡