Test data volume - PowerPoint PPT Presentation

Chapter 2

Chapter 2. Digital Test Architectures. What is this chapter about?. Introduce Basic Design for Testability (DFT) Techniques Focus on Widely Used or Emerging DFT Architectures Illustrate Basic Test Architectures, Low-Power Test Architectures, and At-Speed Test Architectures.

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Test and Test Equipment July 2010 San Francisco, USA

Test and Test Equipment July 2010 San Francisco, USA. Roger Barth - Micron ITRS Test TWG. Sanjiv Taneja Satoru Takeda Sejang Oh Shawn Fetterolf Shoji Iwasaki Stefan Eichenberger Steve Comen Steve Tilden Steven Slupsky Takairo Nagata Takuya Kobayashi Tetsuo Tada Tom Williams

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Test and Test Equipment July 2011 San Francisco, California

Test and Test Equipment July 2011 San Francisco, California. Dave Armstrong. 2011 Test Team. Jerry Mcbride Jody Van Horn Kazumi Hatayama Ken Lanier Ken Taoka Ken-ichi Anzou Khushru Chhor Masaaki Namba Masahiro Kanase Michio Maekawa Mike Bienek Mike Peng Li Mike Rodgers Paul Roddy

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