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Scanning probe microscopy (SPM) and lithography

Scanning probe microscopy (SPM) and lithography. Atom and particle manipulation by STM and AFM. AFM oxidation of Si or metals. Dip-pen nanolithography (DPN). Resist exposure by STM field emitted electrons. Indentation, scratching, thermal-mechanical patterning.

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835 views • 43 slides

The atomic scale investigation of Nb for superconducting RF cavity

The atomic scale investigation of Nb for superconducting RF cavity. Kevin Yoon, David N. Seidman – Northwestern University Claire Antoine, Chris Boffo Fermi National Accelerator Laboratory May 23-24, 2007 Fermilab. Atom-probe tomography (APT).

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333 views • 16 slides

Piezoelecticity

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171 views • 8 slides

Piezoelecticity

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99 views • 8 slides

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