Wafer probing - PowerPoint PPT Presentation

FE-I4 Test Setup Hardware Needs: Boards &amp; Interfaces

FE-I4 Test Setup Hardware Needs: Boards &amp; Interfaces. March 1 st 2010, Marlon Barbero. FE-I4 Wafer Probing. FE-I4 wafer probing :. FE-I4 compatible. Connector. FE-I4 wafer level tests. extension board. adapter card. probe card. Stand-alone FE-I4 test card. FE-I4 single chip test card :.

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144 views • 11 slides

Electrosort Automation Die Sorting vs. Wafer Probe

Die Sorting Screens out electrical failures before assembly, thus improving assembly &amp; final test yield, which reduces overall manufacturing cost. Screens out die that were damaged during dicing &amp; demounting process before packaging, thus reducing overall manufacturing cost. Wafer Probe

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176 views • 4 slides

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Wafer probing - PowerPoint PPT Presentation

FE-I4 Test Setup Hardware Needs: Boards &amp;amp; Interfaces

Electrosort Automation Die Sorting vs. Wafer Probe

FE-I4 Test Setup Hardware Needs: Boards & Interfaces