'Writeability' diaporamas de présentation

Large-Scale SRAM Variability Characterization Chip in 45nm CMOS

Large-Scale SRAM Variability Characterization Chip in 45nm CMOS. High end microprocessors continue to require larger on-die cache memory > 6 ? of statistics needed to capture the variability of large cache memories Problem: Getting statistics across large designs is $$ and difficult

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