X-ray Analysis of Fully Depleted Thick CCDs: Pixel Size, CTE Measurements, and Defect Diagnostics

Feb 14, 2026

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This study presents an in-depth analysis of fully depleted thick charge-coupled devices (CCDs) with small pixel sizes, focusing on X-ray measurements conducted at Brookhaven National Laboratory. The research explores the performance metrics, including charge transfer efficiency (CTE) measurements and defect diagnostics, using 55Fe data. The findings provide insights into optimizing CCD design for enhanced imaging and detection capabilities in high-energy physics applications.

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X-ray Analysis of Fully Depleted Thick CCDs: Pixel Size, CTE Measurements, and Defect Diagnostics

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