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The 2000 electronic/thermal test model

The 2000 Electronic/Thermal Test Model, developed by Justin Greenhalgh, aims to improve testing methods for noise performance and electromagnetic compatibility (EMC) rejection. This model facilitates more realistic thermal tests and enhances our understanding of superconductor (SC) production processes. It includes a robust metal backplate, accommodates four SC locations, integrates two Supercrystals, features a 50-channel readout box, and incorporates a dummy moderator with fiber optic light monitoring. This comprehensive setup provides invaluable hands-on assembly experience for SCs.

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The 2000 electronic/thermal test model

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  1. The 2000 electronic/thermal test model Justin Greenhalgh, RAL

  2. Purpose • To allow better testing of noise performance and EMC rejection • To allow more realistic thermal tests • To progress our experience of SC production • To give hands-on feel for assembly of SCs to backplate

  3. Scope • A metal part-backplate, full thickness, large enough to encompass four SC locations. • Two Supercrystals • A 50-channel readout box • Dummy moderator • ? FO light monitoring • A thermal enclosure

  4. Timescale

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