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RF Reconfiguration and Testing

This presentation discusses recent advances in RF (Radio Frequency) reconfiguration and testing methodologies, particularly focusing on LNAs (Low Noise Amplifiers) and RF-DC detectors. Key challenges such as measurement inconsistencies at high frequencies due to PCB material limitations are addressed, along with proposed solutions involving new Rogers PCBs. It also covers innovative testing setups for offset loopback and emphasizes the importance of DC measurements for fault detection in RF circuits. Future plans include developing a new test board for comprehensive chip measurements and transceiver tests.

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RF Reconfiguration and Testing

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  1. RF Reconfiguration and Testing Rashad Ramzan and Jerzy Dabrowski Linköping University Dept. of Electrical Engineering SE-581 83 Linköping, Sweden

  2. Outline • Testable LNA • RF-DC Detector • Offset-Loopback • Summary, Future Planes

  3. Recent Chip: RF Sampling Frontend • A 1.4V, 25mW Wideband Testable LNA in 0.13m CMOS

  4. Recent Chip: RF Sampling Frontend

  5. Resent Chip: RF Sampling Frontend • Due to “PCB” we are not able to measure NF at high frequencies? • Traces are not even. • FR4 not good for >1GHz • Connector Pad parasitics & impedance discontinuities • Remedy: We are working on it …….. • New PCB with Rogers not FR4 or Thin Film Technology • TRL calibration

  6. RF Testing- RF to DC Detector • Idea! Only from DC measurements. • All catastrophic faults can be detected. • Some of parametric faults. • Performance parameter like Gain, 1dB CP • And may be NF & IP3 • Calibration of Detectors with DC/Low voltage signals only

  7. R e c e i v e r (zero-IF) Base Band Processor LPF ADC LNA TA Test xtest Q I I Q I Q LO DAC 900 LPF IQ offset mixer Amp T r a n s m i t t e r IQ test signal QPSK is the simplest implementation but others can be used as well RF Testing- Offset Loopback • Test setup using IQ offset mixer for shared LO Tx band Rx band f fTx fRx f

  8.  =160 RF Testing- Offset Loopback • Test setup using IQ offset mixer for shared LO Tx I Rx I Tx Q  =160  =50 (skew) Rx Q

  9. Future Planes • New board for complete Chip measurements. • Test for Transceivers with polar modulator (shared LO) multistandard Transceivers. (with Phillips) • On-Chip phase noise measurements

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