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Current Testable Design of Resistor String DACs

Current Testable Design of Resistor String DACs. Proceedings of the third IEEE international workshop on electronic design, Test and Applications , 2005 指導老師 : 易序忠 班級 ：積體碩一 姓名 ：黃順和 學號 ： 95662009. outline. 1. Introduction 2. Supply current tests of resistor

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Current Testable Design of Resistor String DACs

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  1. Current Testable Design of Resistor String DACs Proceedings of the third IEEE international workshop on electronic design, Test and Applications , 2005 指導老師 : 易序忠 班級 ：積體碩一 姓名 ：黃順和 學號 ：95662009

  2. outline • 1. Introduction • 2. Supply current tests of resistor string DACs • 3. DFT of DACs for current testing • 4. Conclusion

  3. Introduction • In this paper, supply current testability is examined experimentally for opens and shorts in a general 3 bit resistor string Digital/Analog converter(DAC). • we attempted to examine testability of shorts and opens in a DAC in order to check the feasibility of DAC testing based on supply current • we show testability analysis results of current testing in a conventional resistor string DAC. Also, we propose a DFT method of such DACs for supply current testing.

  4. Supply current tests of resistor string DACs • A resistor string DAC is made of a resistor string and MOS switches. Besides them, an operational amplifier and inverter gates are added to the DAC. • In our experiments, a short is inserted between targeted terminals by adding a resistor of 0.1Ω between them in the Spice file of the defect-free circuit. An open is inserted to a targeted terminal by adding a resistor of 10GΩ to the SPICE file.

  5. 3 bit resistor string DAC

  6. DFT of DACs for current testing • shorts in DACs will be detected, but opens in MOS switches will not be detected by the current testing • In our design, a transfer gate, an inverter gate and a resistor, Rp, are added to the conventional DAC. In the normal mode, Tst is H. In the test mode, Tst is L and current through Rp is measured.

  7. Our proposed DAC

  8. Conclusion • In order to detect them by current testing, we have proposed a DFT method for register string DACs. It is shown experimentally that all of the opens and shorts will be detected in resistor string DACs designed by using the DFT method. • Exhausted test vector application is required in testsof the testabledesigned DAC. It leads to long test time and some restriction in application of the DFT method.

  9. Layout of our testable DAC

  10. Defect coverage of DAC • Defect coverage of our testable DAC

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