1 / 33

A Universal Logic Restructuring Technique:

A Universal Logic Restructuring Technique:. Irredundancy Removal and Addition. Speaker : Chun-Chi Lin Advisor : Chun-Yao Wang. 2008.07.22. Outline. Introduction Notations and Background Proposed approach Conclusion. Redundancy Addition and Removal. A circuit rewiring technique

yuma
Télécharger la présentation

A Universal Logic Restructuring Technique:

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript


  1. A Universal Logic Restructuring Technique: Irredundancy Removal and Addition Speaker : Chun-ChiLin Advisor : Chun-Yao Wang 2008.07.22

  2. Outline • Introduction • Notations and Background • Proposed approach • Conclusion

  3. Redundancy Addition and Removal • Acircuit rewiringtechnique • The objective is to add someredundant wires/gates such that a given target wire becomes redundant • It will not change the functionality of the circuit

  4. A RAR Example Add redundant wire(g1 → g4) can make wire(c → g2) become redundant a g2 b target wire g1 c o1 d g3 g4 o2 e

  5. ATPG-based RAR approach • Little memory requirement for large circuits • Two-stage algorithm • Build up candidate set for the target wire • Redundancy tests on each candidate wire • One-stage algorithm • Without redundancy tests • The rewiring capability is not as good as two-stage algorithm

  6. ATPG-based RAR approach The capability of alternative wires identification is limited by the Mandatory Assignments (MAs) Multiple wire/gates addition still only considers the gates are the MAs for addition

  7. ATPG/Diagnosis-based Design Rewiring (ADDR) • A rewiring technique using ATPG anddiagnosis • With more rewiring capability • Step1: • Inject a design error first, where the error results in the removal of a target wire • Step2: • Generate test vectors for the error by ATPG

  8. ATPG/Diagnosis-based Design Rewiring (ADDR) • Step3: • Input the original circuit, error circuit, and test vectors. Search the possible corrections for the error using simulation-based Design Error Diagnosis and Correction • Step4: • Verify the circuit after the correction • However, the target wire cannot be removed if no corrections

  9. Problem Formulation • Given: • An arbitrarily target wire in a combinational circuit • Objective: • Remove the target wire, the functionality may change • Rectify the functionality by adding some wire/gates

  10. Outline • Introduction • Notations and Background • Proposed approach • Conclusion

  11. Notations and Background • Controlling value, cv(g) • An input of a gate g has a cv(g) if this value determines the output of g regardless of the other inputs • Non-controlling value, ncv(g) • An input of a gate g has a ncv(g) if this value cannot determine the output of g directly • For example • AND gate has cv 0 and ncv 1

  12. Notations and Background • Dominator • The dominators of a wire w is a set of gates G such that all paths from w to any POs have to pass through all gates in G • Fault propagating inputs • Consider the dominators of a wire w, the inputs of a dominator are the inputs in the transitive fanout of w • Side inputs • Other inputs of a dominator

  13. Notations and Background a g2 b target wire g1 c o1 d g3 o2 g4 e • For example • The dominators of the target wire is {g2, g3, g4} • Side inputs are {a, b, d, e}

  14. Notations and Background • For stuck-at-fault test on a wire w(gs→gd) • Set cv at the source gs to activate the fault effect • Set ncv for all side inputs of w’s dominators to propagate the fault effect • The wire is redundant, if no test vector exists

  15. Notations and Background • Mandatory assignments (MAs) • The unique value assignments to gates required for a test to exist • MAs are obtained by • Activating the target fault effect • Setting side inputs of dominators • Implications • Recursive learning can find more MAs

  16. Notations and Background • Forced MA • An MA that causes the target fault untestable while violating it • Forced MAs are obtained by • Activating the fault • Setting side inputs to ncv • Backward implications

  17. Notations and Background g2 1 1 a 1 b g1 c 0 o1 0 d target wire g3 1 0 0/1 g4 o2 e 1 • A MAs Calculation Example • MAs are {g1=0, c=0, d=0, e=1, g3=1, g2=1, a=1, b=1} • These MAs are both forced MAs

  18. Outline • Introduction • Notations and Background • Proposed approach • Conclusion

  19. Opposite direction of RAR • Remove an irredundant wire, then add an other irredundant wire to rectify the functionality of the circuit • This process is called IRredundancy removal and addition (IRRA) a g2 b target wire g1 c o1 d rectification wire g3 g4 o2 e

  20. Source MA (SMA) Given a set of MAs for a target fault, the MA whose transitive fanin cone contains no MAs is a source MA (SMA) The cofactor result with respect to all SMAs is the same as with respect to all MAs

  21. A SMA example g2 1 a b g1 c 0 o1 0 d target wire g3 1 0 0/1 g4 o2 e 1 • MAs are {g1=0, c=0, d=0, e=1, g3=1, g2=1} • SMAs are {c=0, d=0, e=1, g2=1}

  22. Rectification location • Adestination gd is selected from the dominators where the rectification occurs • The differences are the minterms • Changed from 0 to 1 • Changed from 1 to 1 • Two networks are defined to represent these differences

  23. EAN & ERN • Given a Boolean network, a target wire and a destination gate gd in the dominators of the target wire • Exact Addition Network (EAN) at gd is the network having minterms changed from 0 to 1 at gd after removing the target wire • Exact Removal Network (ERN) at gd is the network having minterms changed from 1 to 0 at gd after removing the target wire

  24. EAN & ERN wt g1 a g3 g5 bc b O a 0 1 0 1 g2 c g4 • For example • Suppose the destination gate gd is g5 • EAN is the network composed of abc • ERN is the network composed of abc

  25. EAN & ERN • Supposes the cofactors of gd with respect to SMA in good/faulty circuits are denoted gdg(SMA) and gdf(SMA), respectively • The product of all SMAs is denoted as AND(SMA) • The Boolean function of EAN at gd is • AND(SMA)·gdg(SMA)·gdf(SMA) • The Boolean function of ERN at gd is • AND(SMA)·gdg(SMA)·gdf(SMA)

  26. EAN & ERN wt g1 a 0 g3 g5 1 b O g2 c g4 • For example • gd is g5 • SMAs are {a=0, b=1} • gdg(a=0, b=1)/gdf(a=0, b=1) = c/c • EANat gd =ab·c·c = abc • ERNat gd =ab·c·c = abc

  27. EAN & ERN • The rectification network at gd after removing the target wire is • (gd+ERN)·EAN • All minterms from 1 to 0 will be changed from 0 to 1 after ORing the ERN • All minterms from 0to 1 will be changed from 1 to 0 after ANDing the EAN • (gd+ERN)·EAN = gd·EAN +ERN

  28. EAN & ERN g5 SMAs … gdg(SMA) gdg(SMA) g5 1 1 SMAs g6 … 0 0 1 g1 g2 0 gd redundant redundant 0 0 gdf(SMA) gdf(SMA) 1 EAN ERN gdf(SMA) = 0 g4 1 g3 gdf(SMA) = 1 … • General scheme of the rectification network • the gdf(SMA)part is redundant

  29. EAN & ERN SMAs SMAs … … gdg(SMA) gdg(SMA) gd EAN ERN … • General scheme of the simplified rectification network • EAN at gd is AND(SMA)·gdg(SMA) • ERN at gd is AND(SMA)·gdg(SMA)

  30. IRRA for single alternative wire identification

  31. IRRA for area optimization

  32. Experimental results

  33. Conclusion

More Related