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San Diego, April 3rd – 5th, 2012

San Diego, April 3rd – 5th, 2012. Conference agenda. List of sessions: Design and Process Hardening Single Event Test Facilities SEE on Commercial Memories Single-Event Transients Single-Event Test Methods Destructive SEE Product, Technology, System SEE. Conference agenda.

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San Diego, April 3rd – 5th, 2012

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  1. San Diego, April 3rd – 5th, 2012

  2. Conference agenda List of sessions: • Design and Process Hardening • Single Event Test Facilities • SEE on Commercial Memories • Single-Event Transients • Single-Event Test Methods • Destructive SEE • Product, Technology, System SEE

  3. Conference agenda • Lot of space and army oriented topics • Memory test (NAND flash), Point of load DC/DC converters, ADC converters, FPGAs… • SET • Mitigation techniques like “scrubing” (removing errors from a memory's content by re-writing it periodically with correct values) • SEL protection by an adjustable over current detection that forces a power cycling of the full system in case of SEL detection • Device hardening by placement of redundant blocks suficciently far apart to not be influenced by the same incident partcle

  4. Quantity of laser aided diagnostics

  5. SET effects due to E-H in various blocks

  6. Studies of SET with short X-ray pulses

  7. SEU location by Laser or X-ray

  8. XILINX FPGA Devices SEE evaluation

  9. XILINX FPGA Devices SEE evaluation Advances in protection of the configuration memory

  10. Destructive test of IGBTs

  11. Destructive test of IGBTs

  12. Conference agenda

  13. Conference agenda

  14. Conference agenda

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