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Radiation Effects on the Aeroflex RadHard Eclipse FPGA

Radiation Effects on the Aeroflex RadHard Eclipse FPGA. Ronald Lake Aeroflex Colorado Springs. RadHard Eclipse Radiation Effects Overview. Test Techniques Single Event Effects Results Single Event Upset Single Event Latch-up Total Ionizing Dose DC Characteristics AC Characteristics

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Radiation Effects on the Aeroflex RadHard Eclipse FPGA

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  1. Radiation Effects on the Aeroflex RadHard Eclipse FPGA Ronald Lake Aeroflex Colorado Springs Lake

  2. RadHard Eclipse Radiation Effects Overview • Test Techniques • Single Event Effects Results • Single Event Upset • Single Event Latch-up • Total Ionizing Dose • DC Characteristics • AC Characteristics • TMR Effects on SEU • Summary Lake

  3. Hardness Testing Conditions - SEE • SEU - 25oC, 2.25V core and 3.0V I/O, in accordance with EIA/JESD57 • SEU - FPGA programmed (configured) with three data storage components • Dynamic Shift Registers - Two at 560 bits • Static Register File - 64 x 16 bits • Static RAM - 55,296 bits • SEL - 125oC, 2.7V core and 3.6V I/O, in accordance with EIA/JESD57 • 208-lead ceramic quad flat-pack (CQFP) Lake

  4. Hardness Testing Conditions - SEU • Alternating ones and zeros data used for all three storage components of the FPGA • National Instruments tester at 1MHz frequency • Write/read shift register • Read only register file and RAM • After a cell upsets, the correct data is re-written to the cell • Texas A&M University Cyclotron Institute • Au, Kr, and Ar from 0o (normal incidence) to 60o Lake

  5. Heavy Ion Beam For SEU Analysis Lake

  6. Hardness Testing Conditions - SEL • Devices statically biased during irradiation • Supply currents monitored for latch-up • Lawrence Berkeley National Laboratory • Au at 41o • Effective fluence at 1E7 ions/cm2 • Effective LET = 120 MeV-cm2/mg • Devices functionally re-verified after irradiation Lake

  7. Heavy Ion Chamber for SEL Analysis Lake

  8. Hardness Testing Conditions - TID • Irradiated under worst case temperature (25oC) and static bias conditions (max VDD) per MIL-STD-883E Method 1019 • FPGA programmed with 60 AC paths • J.L. Shepherd model 81-22 Cobalt 60 gamma cell Lake

  9. Cobalt 60 Total Ionizing Dose System Lake

  10. Single Event Upset Data Plot Lake

  11. Hardness Results - SEE SEU - Error-rates - GEO orbit, Adam’s 90% WC SEL - No latch-up to 120 MeV-cm2/mg TID - 113 rads(Si)/s FPGA meets datasheet ACs and DCs post 300 krad(Si) Lake

  12. Hardness Results - TID - Supply Current DCs Most Shifted DCs - Post radiation minus Pre-rad Lake

  13. Hardness Results - 100 krad(Si) TID - ACs 5 most shifted ACs on each of 2 devices Post 100 krad(Si) minus Pre irradiation Lake

  14. Hardness Results - 300 krad(Si) TID - ACs 5 most shifted ACs on 2 devices Post 300 krad(Si) minus Pre irradiation Lake

  15. RadHard Eclipse Single Voter TMR Lake

  16. RadHard Eclipse Single Voter Data Error-rates based on SpaceRadiation 4.0 Weibull analysis, Geo orbit, Adam’s 90% WC environment * Estimate based on assumed onset LET of 100 and saturated x-section of 7E-9 Lake

  17. RadHard Eclipse Single Voter Data 8/17/4 TMR2 Data : TAMU Lake

  18. Summary • Completed RadHard Eclipse FPGA pre-qualification evaluation of radiation performance • Low Single Event Upset error rate (geosynchronous orbit, Adams 90% worst case environment) • Single Event Latch-up immune to > 108 MeV-cm2/mg • Passes datasheet parameters to > 300 krad(Si) Total Ionizing Dose • TMR design maps well to logic cell architecture • Offered as a flight qualified QML Q & V RadHard Standard Microcircuit Drawing device Lake

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