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Muon Sorter Tests: Status and Results

This document provides the status and results of the Muon Sorter tests conducted at Rice University in January 2004. It includes information on the test goals, hardware problems discovered, test results, safe window for data latching, and future plans.

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Muon Sorter Tests: Status and Results

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  1. Sector Processor – to – Muon Sorter tests M.Matveev Rice University January 8, 2004

  2. Muon Sorter Status • Four boards have been built and assembled in 2003 • Have only one mezzanine FPGA (Virtex XC2V4000) in hand

  3. SP-to-MS Test 32 bits 80 Mhz VME VME Data FIFO 3 muons LVTTL- to- GTLP GTLP- to- LVTTL Sorter Data FIFO 4 muons 2 bits 80 Mhz VME Winner FIFO 2 bits GTLP- to- LVTTL LVTTL- to- GTLP FPGA FPGA Sector Processor Backplane Muon Sorter • Goals of the test • Verify integrity of data transmission • from SP to MS • Verify “winner” feedback path • Check SP-to-MS-to-GMT latency

  4. Clocking Scheme Sector Processor 32 data bits @ 80 Mhz Muon Sorter FF LVTTL-to-GTLP SN74GTLPH16912 GTLP-to-LVTTL SN74GTLPH16912 FF Adjustable 80Mhz 80Mhz Pt LUT 80Mhz FPGA 2 winner bits @ 80 Mhz 40Mhz from CCB 40Mhz from CCB FPGA Adjust 80Mhz FF GTLP-to-LVTTL SN74GTLPH16945 LVTTL-to-GTLP SN74GTLPH16912 FF 80Mhz Track Finder Backplane • Adjustable 80Mhz clock • Output from Virtex-2 Digital Clock Manager (DCM) • Fine phase adjustments with a resolution of ~100 ps (MS) • Can be done dynamically from VME

  5. MS mezzanine FPGA

  6. CCB Modification We have built a small patch board with 40.078Mhz VCXO oscillator that allows to test SP with MS without TTC system or hardware changes (replace oscillator) on CCB board

  7. Testing Software • Load 254 patterns (2 frames each) representing 1, 2 or 3 • muons into Sector Processor FIFO over VME • Load fine phase adjustments for SP and MS clocks • Send testing patterns out of SP FIFO at 80Mhz on CCB • command • Read MS FIFO buffers over VME and compare against • expected results • Read “winner” FIFO from SP over VME and compare • against expected results

  8. GTLP Backplane Signals 1.5V 1.0V 0.5V 0V Typical 25 ns GTLP signal Vref_transmitter = 1.0V GTLP Bit_2 from SP to MS Vref_transmitter_1 (SP) is floating GTLP Bit_29 from SP to MS Vref_transmitter_2 (SP) is floating

  9. Hardware problems discovered • Sector Processor • Vref pins of GTLP transmitters shouldn’t be floating • (were connected to 1.0V) • SP doesn’t have GTLP terminators for both “winner” • lines (were added) • Backplane • MS_config_done signal was routed to MPC_reserved[0] • line (both are outputs!) on the backplane

  10. Test Results • No data errors after 275K test iterations (BER < 2.5x10-10) • No winner errors after 275K test iterations (BER < 4x10-9) • Have checked the SP on all slots (except 11 and 21). • Did not find any issues related to mezzanine FPGA.

  11. Safe Window for Data Latching • ~10 ns for 2 winner bits (SP) • ~8 ns for 32-bit random patterns (MS) • ~6.5 ns for specific 32-bit patterns • (1st frame = f0f0f0f0, 2nd frame = 0f0f0f0f). • The reason is that the mean propagation delays of GTLP • transceivers (low-to-high and high-to-low) are changing • with number of switching outputs. See Fairchild AN-5002.

  12. Latency (LVTTL-GTLP-LVTTL + backplane) SP1 MS 9 ns

  13. FPGA Latency FPGA Input FPGA Output 150 ns

  14. Latency LVTTL-LVDS-LVTTL + 1 m SCSI cable MS Output “GMT” Input 11 ns

  15. Future Plans • More sophisticated tests at Rice (sorting logic, timing). • Need another Sector Processor • Prepare the second MS for tests at UF (need another • mezzanine FPGA)

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