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A Diagnostic Test Generation System and a Coverage Metric

2010 European Test Symposium. Prague, March 24-28, 2010. A Diagnostic Test Generation System and a Coverage Metric. Yu Zhang and Vishwani D. Agrawal Auburn University, Dept. of ECE Auburn, AL, 36849, USA. 1. Exclusive test. 3. Diagnostic fault simulation

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A Diagnostic Test Generation System and a Coverage Metric

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  1. 2010 European Test Symposium Prague, March 24-28, 2010 A Diagnostic Test Generation System and a Coverage Metric Yu Zhang and VishwaniD. Agrawal Auburn University, Dept. of ECE Auburn, AL, 36849, USA 1. Exclusive test 3. Diagnostic fault simulation Example – 8 faults, 4 vectors An exclusive test is a test that detects only one fault from a fault pair. • C0: A fault free circuit • C1: CUT with fault f1 • C2: CUT with fault f2 sa0 4. Coverage Metric Simplified: 5. Diagnostic Test Generation System sa0 2. Exclusive Test Pattern Generation 6. Results for ISCAS’85 benchmarks 1 sa0 10 3 22 20 2 Sa0 or Sa1 y 14 16 11 1 10 6 21 22 23 3 20 15 7 2 19 16 sa1 14 11 6 21 15 23 19 7 *Intel Core 2 Duo 2.66GHz, 3GB RAM. Contact email: yzz0009@auburn.edu, vagrawal@eng.auburn.edu

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