'Junction leakage' diaporamas de présentation

Kaushik Roy Purdue University

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CHAPTER 5-2

CHAPTER 5-2. 5.10 ~ 5.15. 5.10 Polysilicon Depletion. 5.10 Polysilicon Depletion. 5.10.1 5.10.2 5.10.3 5.10.4. 5.10 Polysilicon Depletion. 5.10.5 5.10.6 5.10.7 5.10.8 5.10.9 5.10.10 5.10.11. 5.10 Polysilicon Depletion. 5.10.12 5.10.13 5.10.14.

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Device Simulation for Single-Event Effects

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J.Y.Kim and Kinam Kim, et all (Samsung Electronics) 2005 Symposium on VLSI Technology

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Draft Technology Table for High-Performance Logic

Draft Technology Table for High-Performance Logic. High-Performance Logic Scaling (IEDM Comparison). Benchmarks taken from IEDM publications; chose only technologies within 1-2 years of production. IEDM Papers with leading-edge bulk (non-SOI) performance selected (Moto, TI, Intel).

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