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Purpose

Purpose. To Measure MSP430 A/D convertor input impulse noise which came from external cable DC jack contact with metal as SEI issued problem. Measuring point. Probed PIN. C413 pin1 for I1+, C413 pin2 for I1-. female CT cable metal partial. Contact with metal partial.

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Purpose

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Presentation Transcript

  1. Purpose To Measure MSP430 A/D convertor input impulse noise which came from external cable DC jack contact with metal as SEI issued problem Prepared by Joe

  2. Measuring point Probed PIN C413 pin1 for I1+, C413 pin2 for I1- Prepared by Joe

  3. female CT cable metal partial Contact with metal partial Scissors metal partial Prepared by Joe

  4. Contact with female CT cable metal partial (1/6) Recording 100 times contact : I1+ Max. volt @1.58V and Min. volt @-1.82 ; peak pulse width @1.6ns Prepared by Joe

  5. Contact with female CT cable metal partial (2/6) Recording 100 times contact : I1- Max. volt @2.96V and Min. volt @-1.8 ; peak pulse width @4.4ns Prepared by Joe

  6. Contact with Scissors metal partial(3/6) Recording 100 times contact : I1+ Max. volt @2.72V and Min. volt @-3.24 ; peak pulse width@2.8ns Prepared by Joe

  7. Contact with Scissors metal partial(4/6) Recording 100 times contact : I1- Max. volt @1.6V and Min. volt @-1.72 ; peak pulse width@3.3ns Prepared by Joe

  8. Power ON noise(5/6) Provided fast power on noise at battery in (VDD) : I1+ Max. volt @5.12V and Min. volt @-6.88 ; peak pulse width@5.2ns Prepared by Joe

  9. Power ON noise(6/6) Provided fast power on noise at battery in (VDD) : I1- Max. volt @5.36V and Min. volt @-8.56 ; peak pulse width@5ns Prepared by Joe

  10. Summary As tested result, the impulse which came from metal contact is very small width and voltage is not so high. Thus, the energy will less than 1pJ (around 1E-14) and provided noise is also lower than fast power on noise. Therefore, in my opinion is that should no harm for MSP430 chipset Prepared by Joe

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