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KLA Tencor SP 2

Bridge Tronic Global is your trusted source for advanced semiconductor manufacturing equipment. We proudly offer the KLA-Tencor SP2, a high-performance surface inspection system engineered for the detection and classification of defects on semiconductor wafers. This tool is widely used in front-end and back-end process monitoring, offering critical inspection capabilities to ensure wafer surface quality. The SP2 system is compatible with a variety of wafer sizes and is renowned for its precision in identifying particulate contamination, scratches, and other surface anomalies. Featuring sophist

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KLA Tencor SP 2

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