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ACTFEL Device Modeling via SPICE

This paper explores the modeling of Fowler-Nordheim diodes using a detailed SPICE framework, developed by J.P. Bender and J.F. Wager at Oregon State University. It introduces a modified Fowler-Nordheim diode model, incorporating both single and double-sheet charge dynamics, field emission mechanisms, and charge capture probabilities. The paper also discusses transient responses, capacitance overshoot, and experimental validations, offering a comprehensive approach to bridging device physics with circuit simulation. This model aims to improve accuracy in electronic device design.

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ACTFEL Device Modeling via SPICE

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  1. ACTFEL Device Modeling via SPICE • J. P. Bender and J. F. Wager • Department of Electrical and Computer Engineering • Center for Advanced Materials Research • Oregon State University • Corvallis, Oregon 97731-3211 • http://www.ece.orst.edu/~jfw

  2. Organization: • Fowler-Nordheim Diode Model • Double-sheet Charge Model

  3. Fowler-Nordheim Diode Model

  4. Fowler-Nordheim Diode model: Q-V

  5. Fowler-Nordheim Diode model: C-V

  6. Fowler-Nordheim model: Transient response

  7. Fowler-Nordheim model: Transferred Charge Curve Fowler-Nordheim Model Experimental Data

  8. FN Model Scaling with Varying Vmax

  9. Modified Fowler-Nordheim Diode Model

  10. Double-sheet Charge Model

  11. Two-sheet Charge Model Band Diagram

  12. Two-sheet Charge Model Equivalent Circuit

  13. Two-sheet Charge Model • 1. Emission Mechanisms • Field emission (pure tunneling) • Thermal emission • Trap-to-band impact ionization • 2. Charge Capture • The probability that an electron crossing a sheet of charge is captured depends on: • Electric field at the sheet • Occupancy of the sheet

  14. Two-sheet Charge Model Space Charge Creation via Field Emission

  15. Two-sheet Charge Model Space Charge Creation via Trap-band Impact Ionization

  16. Two-sheet Charge Model: Static Space Charge • Ionized traps are not allowed to refill • FB= 1.5 V (experimental value) • Bulk trap depth = 1.38 V

  17. Transferred Charge Capacitance Overshoot (Two-sheet charge model) Experimental Data Fowler-Nordheim Diode model

  18. Conclusions • Fowler-Norheim Diode • Simple yet accurate SPICE model for devices without space charge • Two-sheet Charge Model • Demonstrates mapping of device physics to SPICE • Large amounts of C-V overshoot in SPICE

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