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FVTX dEdx digitization

This study focuses on the digitization process applied to energy loss measurements in detector strips, with a specific emphasis on Kaon identification stemming from high-energy pT events. By analyzing charge sharing and energy loss distribution, the research evaluates the efficiency of digitization methods through various ADC configurations. The findings highlight the importance of precise ADC cuts in distinguishing true high-pT muons from background noise, particularly in the context of Kaon contributions. Results demonstrate a cut efficiency of 77% for 3-bit and 87% for 4-bit digitization frameworks.

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FVTX dEdx digitization

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  1. FVTX dEdx digitization Zhengyun You Peking University Los Alamos National Lab Jun 05, 2007

  2. 300 µm 75 µm / strip eStrip4 eStrip3 eStrip2 eStrip1 Charge sharing on strips From position in and out to get a hit’s length on each strip; Digitize hit’s energy loss by length on each strip;

  3. E loss distribution E loss on a layer; E loss on a strip; pT = 2GeV Kaon pT = 2GeV Kaon µ from W pT > 10GeV µ from W pT > 10GeV ADC ADC

  4. Digitization Digitize with 3 bit [1500, 30000] E loss on a layer Sum of E loss on strips (after digi) 18500 µ from W pT > 10GeV pT = 2GeV Kaon pT = 2GeV Kaon µ from W pT > 10GeV ADC ADC

  5. Digitization Digitize with 4 bit [1500, 30000] E loss on a layer Sum of E loss on strips (after digi) 18500 pT = 2GeV Kaon pT = 2GeV Kaon µ from W pT > 10GeV µ from W pT > 10GeV ADC ADC

  6. Cut Cut on ADC of each hit on a track (Only all (4) hit’s ADC > cut value will be considered as µ from W) ADC precise ADC after digitization 18500 ADC cut :18700 One hit’s ADC distribution pT = 2GeV Kaon µ from W pT > 10GeV ADC

  7. Efficiency of Kaon W efficiency 3 bit (77% pT>20) W efficiency 4 bit (87% pT>20) Kaon’s rejection factor : Precise value : ~ 40 4 bit : ~ 30 3 bit : 20

  8. Real high pT µ from W Real low pT Kaon W ‘s fake high pT background primary_pt<2GeV contribute ~90% of fake high reco_pt background K ‘s contribution is 91% , π is only 9% ; Cut efficiency :dE/dx (fvtx track required) vs primary_pT π+ K+

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