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Analysis Meeting on Higgs to Muon Decay at 1.4 TeV: Methodology and Background Fitting

This document summarizes the findings from the LCD Working Group analysis meeting held on April 18, 2013, at Vinča, Belgrade. It discusses the implications of double-sided Gaussian and composite Gaussian fits applied to Higgs to muon decay data at 1.4 TeV, providing insights into the background processes involved. The meeting focused on improving the shape description through likelihood ratio methods and establishing processes for fitting backgrounds either separately or collectively. Detailed results and comparisons through pull distributions are highlighted for further analysis.

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Analysis Meeting on Higgs to Muon Decay at 1.4 TeV: Methodology and Background Fitting

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  1. Higgs to  at1.4 TeV update HEP Group , Vinča Belgrade I. Bozovic-Jelisavčić, G. Dumbelović, S. Lukić, M. Pandurović LCD-WG Analysis meeting 18. 04.2013.

  2. Signal pdf -Double-sided Gaussian - Composite Gaussian: exp. tail + - (5 parameters) flat tail (7 parameters) - used at 3TeV ( C.Grefe, PhD Thesis, Uni. Bonn, - only oneσ 2012 ,LCD Note-2011-035 ) - Better description of the shape • Likelihoodratio: ,Nevt= 9434 - Will make pull distribution for both to • compare LCD-WG Analysis Meeting 18th April 2013.

  3. Background pdf Separate fit of each background channel : - fit each background process individually - combine (AddPdf) - many processes to fit LCD-WG Analysis Meeting 18th April 2013.

  4. Background pdf- weighted unbinned likelihood fit of the overall background Alternative: - fit all backgrounds together - issue:normalization of different processes? - solution: use weighted dataset - normalization constant = weight wi LCD-WG Analysis Meeting 18th April 2013.

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