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This document summarizes the calibration of Excess Noise Ratio (ENR) conducted during the 432 & UP Swedish EME Meeting organized by SM4IVE in Örebro from May 13-15. The focus is on testing the Device Under Test (DUT) against a reference standard, using cardinal frequency points to calculate the ENR values. Results derived from the DUT will be compared to previously recorded reference values, providing key insights into the performance and reliability of the DUT in relation to established standards.
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ENR calibration The 432 & UP Swedish EME Meeting organized by SM4IVE in Örebro May 13-15 Reference ENR Agilent SNS N4000AS/N MY44420135Cal 3-Dec-2010
Test Description The Exess Noise Ratio (ENR) test is based on comparing the DUT test results to a reference standard test results. The ENR of DUT is then calculated at the cardinal frequency points using the following equation: In the following graphs: DUT = The calculated ENR values REF = Previously recorded ENR values if available