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FTK Simulation: Implementation and Pattern Matching

This project focuses on the implementation of the Fast TracKer (FTK) simulation, specifically on pattern recognition using pattern matching techniques. It also explores the use of Don't Care bits (DC bits) to improve resolution and efficiency.

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FTK Simulation: Implementation and Pattern Matching

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  1. FTK simulation Don’t Care bits implementation (DC bit) Dimos Sampsonidis Aristotle University of Thessaloniki IAPP Project 324318 FTK 1st EU Mid-Term Review meeting Brussels, 7 November 2014 IAPP Project 324318 FTK

  2. Dimos Sampsonidis • Assist. Professor, Physics Department, Aristotle University of Thessaloniki, Greece • Expertise: Experimental Particle Physics, Detector Physics, Computational Physics • Involved in ATLAS Experiment (Muon Spectrometer) • Involvement in WP4, the FTK simulation. IAPP Project 324318 FTK

  3. Fast TracKer (FTK) The Event Compare the Event Hit Pattern with many Stored patterns – The comparison with all patterns has to be done in parallel! The Pattern Bank (AM Bank) ... TRACKING WITH PATTERN MATCHING IAPP Project 324318 FTK

  4. Pattern recognition SS  road Bingo table module strip bingo Road 1 2 3 4 5 4 hit 13 13 ss 1 2 3 SS 6 ss 13 14 15 6 6 8 8 13 8 ss 4 5 6 8 ss 3 ss 1 ss 3 ss 2 ss 3 ss 13 ss 1 ss 1 ss 13 ss 2 ss 16 17 18 ss 4 ss 6 ss 6 ss 4 ss 6 ss 5 ss 5 ss 6 ss 16 ss 5 11 11 ss 7 8 9 8 ss 9 ss 7 ss 8 ss 8 ss 8 ss 8 ss 9 ss 7 ss 19 ss 7 6 Road 6 7 8 9 10 ss 19 20 21 ss 11 ss 10 ss 11 ss 10 ss 11 ss 22 ss 12 ss 10 ss 11 ss 12 13 ss 10 11 12 ss 22 23 24 11 6 8 6 11 11 11 track Thank you Naoki ϕ IAPP Project 324318 FTK

  5. Pattern Matching • 8 patterns compatible with a track when each layer is divided into two bins. • SS with reduced width (factor of two), we have four possible patterns consistent with the matched pattern in the previous step. IAPP Project 324318 FTK

  6. Resolution in FTKSim (I) Pattern in AM chip w/o the DC • Pattern Bank is in coarse resolution (smaller size). • The track fitting should be done in the full resolution (detector) • Going from the coarse resolution to the full we use the Don’t Care Bit Information. • The DC bits allow to reduce the match precision where required • DC allows to merge similar pattern in favored configurations (less patterns) maintaining high-resolution and rejection power where convenient DC set Pattern in AM chip w/ the DC IAPP Project 324318 FTK

  7. Resolution in FTKSim (II) • AIM: to implement a new scheme of AM patterns combining the SS+DC info in a single structure. • New scheme: the SS presentation includes the DC and HB info • A modified version of the SS (same SS calculation for the course resolution) + HBmask copied in the LSB (this allow to keep the full precision since the beginning). • Τhe Dcmaskadded. • The new “pattern format” is translated. • Test with the ttbar MC data (on going). IAPP Project 324318 FTK

  8. Training • On FTK Simulation • Working in Industry CAEN (the only European Producer of Nuclear Electronics) • Software carpentry bootcamp (Pisa, Jun 4-6, 2014). • Management Training - Horizon 2020, July 22, 2014. • Italian Language, (Uni Pisa, June-July 2014). IAPP Project 324318 FTK

  9. Thank you IAPP Project 324318 FTK

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