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Atomic Force Microscopy: Measurements at the Molecular Level. By: Jonathan Miller. The Basic Principles. The cantilever’s tip either slides or ‘taps’ across the sample A laser reflects the cantilever’s deflection A plot of the laser deflection vs. tip position gives the topography.
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Atomic Force Microscopy:Measurements at the Molecular Level By: Jonathan Miller
The Basic Principles • The cantilever’s tip either slides or ‘taps’ across the sample • A laser reflects the cantilever’s deflection • A plot of the laser deflection vs. tip position gives the topography
Force Volume Imaging Biological & Biomaterial Applications Semiconductor Process Monitoring Polymers Etc. Applications
Digital Instruments Web Page: http://www.di.com Updated 2002 Veeco Instruments Inc. Web Page: http://www.veeco.com Updated 2002 University of Macromolecular Crystallization Laboratory Web Page: http://www.che.utoledo.edu/mcl.htm Kaker.com Web Page: http://www.kaker.com/mvd/vendors.html Updated Sept 2002 NRL Navy Web Page: http://stm2.nrl.navy.mil/how-afm/how-afm.html Resources
http://www.chembio.uoguelph.ca/educmat/chm729/afm/firstpag.htmhttp://www.chembio.uoguelph.ca/educmat/chm729/afm/firstpag.htm Further Resources