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CSC Trigger Primitives Test Beam Studies

CSC Trigger Primitives Test Beam Studies. Main Test Beam 2003 Goals: Verify the peripheral crate electronics (mainly DMB/TMB) are ready for production. Complete a trigger electronic chain test from CSCs all the way to the Track-Finder trigger. Subsidiary Goals:

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CSC Trigger Primitives Test Beam Studies

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  1. CSC Trigger Primitives Test Beam Studies • Main Test Beam 2003 Goals: • Verify the peripheral crate electronics (mainly DMB/TMB) are ready for production. • Complete a trigger electronic chain test from CSCs all the way to the Track-Finder trigger. • Subsidiary Goals: • Find and fix hardware/firmware bugs and annoyances. • Find and fix software bugs and annoyances. • (Re-)demonstrate proper triggering and DAQ readout. • Shake out new OO software package.

  2. Beam Test Setup TTC crate Trigger primitives DAQ Data PC Peripheral Crate 2 DMB, 2 TMB 1 CCB, 1 MPC FED crate 1 DDU Track finder Crate TRIDAS beam S1 S3 S2 CSC 2 CSC 1

  3. 2 CSC’s, all on-chamber boards Peripheral crate Track Finder CMS readout board Up to 80K events read out in 2.6s spill / From front end cards CCB + TTCRx MPC 2 TMBs and DMBs Beam Test Setup

  4. Typical Muon Event (CSC1 tilted)

  5. 2003 Test Beam Chronology • Phase I – structured beam • May 23-June 1 • ALCT timing tests • CLCT and TMB studies • High-rate tests • Phase II – unstructured beam • June 13-28 • CLCT and TMB studies • Low-rate and high-rate tests • Phase III – additional structured beam • September 18-22 • Trigger optical link data transmission tests (MPC to SRSP)

  6. Phase I Results • Optimal timing found • Fairly high efficiency (~98-99%) achieved • Peripheral crate system basically working as desired • Chamber angle, HV, threshold scans

  7. 1.2 ms 23 ms SPS orbit period 2003 Synchronous Beam Structure 48 bunches 25 ns bunch spacing bunch width 3-5 ns Structure repeats during 2.6 s spill length

  8. Bunch Structure, ALCT Delay Tuning • BX efficiency vs. ALCT delay setting 0-31 ns • Expect muons in 48 out of 924 bx verified by CLCT bxn from data Chamber 1 Chamber 2

  9. BX Distributions With Optimal Anode Delays • Note logarithmic scale • Cathodes: • Data mostly in 3 bx (no fine time-adjustment possible) • Anodes: • Data 98.7% in 1 bx (after fine time-adjustment) • Chamber 1 • Chamber 2

  10. CLCT Positions • Relative position of key half strip from CLCTs from chamber 2 vs. Chamber 1 • Note: Chamber 1 is vertically higher than Chamber 2 (thus the offset in position). • Zoom

  11. LCT Efficiency vs. Comp. Thresh. • HV=3600v

  12. LCT Efficiency vs. HV

  13. Chamber #1 CLCT 2,000 1,500 CLCT Rate (KHz) 1,000 data consistent with dead-time = 225 ns 500 0 0 500 1,000 1,500 2,000 2,500 3,000 Beam Intensity (KHz) Expected LCT rate at LHC < 25 KHz (ME1/1) Trigger Rate Tests SLHC (10xLHC) SLHC (10xLHC)

  14. Number of LCTs (Run 529) • Cathodes show ~4% 0-LCT events • Early run, before timing tuned • Anodes show ~10% 2-LCT events

  15. Look at 2-ALCT events • Differences: • Bunch crossing counter • Wire group

  16. An Event w/ 2 Chamber 1 ALCTs • Anode hits satisfy 6-hit requirement in 2 adjacent key wire groups

  17. x___ x___ xx__ _x__ _xx_ __x_ pattern 1 _x__ _x__ _x__ _x__ __x_ __x_ pattern 2 x___ x___ xx__ _x__ _x__ _x__ pattern 3 _x__ _x__ _x__ _x__ _x__ _x__ pattern 4 __x_ __x_ _xx_ _x__ _x__ _x__ pattern 5 _x__ _x__ _x__ _x__ x___ x___ pattern 6 __x_ ly 0 __x_ ly 1 _xx_ ly 2 _x__ ly 3 xx__ ly 4 x___ ly 5 pattern 7 TMB Patterns Patterns and Quality in ALCT and TMB Logic • Patterns: xxx__ ly 0 _xx__ ly 1 __x__ ly 2 __xx_ ly 3 __xxx ly 4 __xxx ly 5 ALCT Pattern • Qualities for ALCT and CLCT: • Quality=3 6 layers in pattern • Quality=2 5 layers in pattern • Quality=1 4 layers in pattern • Quality=0 <=3 layers in pattern

  18. Half-/Di-Strip CLCT Patterns • Nominally phi_b=0, but small tilts, esp. chamber 2

  19. CLCT Quality, Pattern vs. Phi_b • Phi_b (tilt) • Quality (layers) • Pattern

  20. Test Beam Periods 2&3 • Timing-in procedures improved & documented • Very high efficiencies achieved • Highest trigger efficiency of 99.9% required low rate (few kHz) • 2-chamber “excellent event” (CFEB, CLCT, ALCT) efficiency limited to 99% due to CFEB timing • Improved scans taken: • Angle scan • HV scan • Comparator threshold scan • Pattern requirements scan • Logic scope read out on most data • True time history of LCTs read by SR/SP input FIFO (see Darin/Alexei talks).

  21. CLCT Pattern Requirements • Example – “excellent event” (2xCFEB, 2xCLCT, 2xALCT) percentages:

  22. Digital Comparisons LCTs vs. Simulation • Simulation “DIGIs” start from raw hit data • ORCA classes used • Added modifications to reflect test beam TMB firmware (due to FPGA limitations) • In principle, tests ALCT, CLCT, and TMB logic. • So far, mainly a good debugging tool for simulation • Present level of ALCT disagreement: • ALCT Wire Group: 1.75%/1.99% • ALCT Quality: 0.15%/0.41% • CLCT disagreement ~10% (see plots on right)

  23. Comparison of LCTs to Simulation • ORCA simulation has some shortcomings and needs updating: • Pretrigger # of layers is still hardcoded. • Was varied during test beam data-taking • No drift delay in ORCA after pretrigger – just uses any hits within 4 bx of some reference bx. • ORCA logic selects highest quality only, doesn’t prefer half-strip patters to di-strip patterns as per hardware. • Simplification for test beam TMB allows only 1 CLCT per CFEB • These are being addressed right now.

  24. Comments on Results • Timing in the system takes effort but getting easier (~2 weeks -> 1 week -> 2 days) • Almost everything can be done remotely with software. • Procedures must really be streamlined to deal with 468 chambers… • When timed in and experts are present: • Electronics hardware is reliable (nothing flaky). • Data quality is terrific, esp. compared to other CMS subsystems… • Trigger and readout efficiencies are very good. • It will be hard work to streamline for 468 chamber operation…

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