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Automatic Test Sequences in Master-Slave Mode

Automatic Test Sequences in Master-Slave Mode. The Automatic Master-Slave Measuring mode is intended for the qualification of leased and dial-up voice frequency circuits . Two ELA 10 connected to the ends of the tested line communicate over the tested line.

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Automatic Test Sequences in Master-Slave Mode

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  1. Automatic Test Sequences in Master-Slave Mode The Automatic Master-Slave Measuring mode is intended for the qualification of leased and dial-up voice frequency circuits. Two ELA 10 connected to the ends of the tested line communicate over the tested line. ■The Master initializes the measurements and collects the results. ■The Slave performs the measurements according to the Master’s commands and sends the results back. Pre-programmed test parameter sets are provided based on recommendations: ■ITU-TM.1020 special quality leased circuits with special bandwidth conditioning ■ITU-TM.1025 special quality leased circuits with basic bandwidth conditioning ■ITU-TM.1040 ordinary quality leased circuits Using pre-programmed test parameter sets ELA 10 provides immediate PASS/FAIL qualification and detailed information about the reasons of failure. 2W Passive Leased Circuits 4W Passive Leased Circuits 2W Active Leased Circuits 4W Active Leased Circuits Dial-up (Switched) Circuits Results of Master-Slave Test ITU-T Rec. for Passive Circuits ITU-T Rec. for Active Circuits To learn more click onthe selectedtopic! ELEKTR NIKA

  2. Qualification of 2W Passive Leased Circuits (Cables) Selected system Selected tests Short form test result Notices: ■The duration of EVENT test is 30 min therefore it is recommended only for trouble shooting ! ■The Jitter & ∆f test is recommended mainly for active circuits ELEKTR NIKA

  3. Qualification of 4W Passive Leased Circuits (Cables) Selected system Selected tests Short form test result Notices: ■The duration of EVENT test is 30 min therefore it is recommended only for trouble shooting ! ■The Jitter & ∆f test is recommended mainly for active circuits ELEKTR NIKA

  4. Qualification of 2W Active Leased Circuits Selected system Selected tests Short form test result Notices: ■The duration of EVENT test is 30 min therefore it is recommended only for trouble shooting ! ■The receiver delay should only be defined in case of extremely long lines ELEKTR NIKA

  5. Qualification of 4W Active Leased Circuits Selected system Selected tests Short form test result Notices: ■The duration of EVENT test is 30 min therefore it is recommended only for trouble shooting ! ■The receiver delay should only be defined in case of extremely long lines ELEKTR NIKA

  6. Qualification of Dial-up (Switched ) Circuits Setting the phone number of slave Selected system Selected tests Short form test result Notices: ■The duration of EVENT test is 30 min therefore it is recommended only for trouble shooting ! ■The receiver delay should only be defined in case of extremely long lines ELEKTR NIKA

  7. Detailed Results of Master-Slave Test Sequences ELEKTR NIKA

  8. ITU-T Recommendations for Passive Circuits Special quality circuits with special bandwidth conditioning Special quality circuits with basic bandwidth conditioning Ordinary quality circuits Not specified ELEKTR NIKA

  9. ITU-T Recommendations for Active Circuits Special quality circuits with special bandwidth conditioning Special quality circuits with basic bandwidth conditioning Ordinary quality circuits Not specified ELEKTR NIKA

  10. THANK YOU FOR YOUR ATTENTION!

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