1 / 8

Tools of Nanoscience

Microscopy Optical Electron SEM TEM Scanning Probe STM AFM NSOM. Spectroscopy Electromagnetic Mass Electron Ion beams FIB Diffraction X-Ray Electron RBS. Tools of Nanoscience. Electromagnetic X-Ray EDS WDS XPS/ESCA XRF UV/Vis UV/Vis Ultraviolet Infrared FTIR Raman.

hamptond
Télécharger la présentation

Tools of Nanoscience

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript

  1. Microscopy Optical Electron SEM TEM Scanning Probe STM AFM NSOM Spectroscopy Electromagnetic Mass Electron Ion beams FIB Diffraction X-Ray Electron RBS Tools of Nanoscience FNI 2A Tools

  2. Electromagnetic X-Ray EDS WDS XPS/ESCA XRF UV/Vis UV/Vis Ultraviolet Infrared FTIR Raman Mass RGA GC/MS SIMS ToF SIMS ICP MS Atom Probe Electron Auger, AES Spectroscopy FNI 2A Tools

  3. γ γ A+ e- e- A+ Sample Spectroscopy Outputs Inputs FNI 2A Tools

  4. Electrons Out • Auger electrons • Secondary electron imaging • Backscattered electron imaging • Transmitted electrons • Electron diffraction Probe: Electrons • Photons out • Energy Dispersive Spectroscopy • Wavelength Dispersive Spectroscopy Electrons In e- e- γ Sample FNI 2A Tools

  5. Probe: Photons • Electrons Out • XPS, X-ray Photoelectron Spectroscopy • Photons Out • FTIR • Raman • Visible • Ultraviolet • X-Ray Fluorescence • X-Ray Diffraction • Photons In • Infrared • Visible • Ultraviolet • X-Rays γ γ e- Sample FNI 2A Tools

  6. Probe: Ions • Ions Out • SIMS, Secondary Ion Mass Spectrometry • ToF SIMS, Time of Flight SIMS, • ICP MS, Inductively Coupled Plasma Mass Spectrometry Ions In A+ A+ Sample FNI 2A Tools

  7. http://www.eaglabs.com/files/literature/BR004.pdf FNI 2A Tools

  8. Optical Microscopes Electron Microscopes Scanning Electron Microscope (SEM) Transmission Electron Microscope (TEM) Scanning Probe Microscopes (SPM) Scanning Tunneling Microscope (STM) Atomic Force Microscope (AFM) X-Ray Analysis Energy Dispersive X-ray Spectroscopy (EDS) Wavelength Dispersive X-ray Spectroscopy (WDS) X-ray Diffraction (XRD) Focused ion beam (FIB) Mass spectrometry/Residual gas analyzer (Mass spec/RGA) Secondary ion mass spectrometry (SIMS) Time of Flight SIMS (ToF SIMS) Fourier transform infrared spectroscopy (FTIR) Auger electron spectroscopy (Auger or AES) Atom probe microscopy X-ray photoelectron spectroscopy (XPS) X-ray fluorescence (XRF) Raman spectroscopy Nanoscience Tools FNI 2A Tools

More Related