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Progress Report on ALD Coating Tests of MCPs for High-Quality Imaging Applications

This progress report details the testing of two microchannel plates (MCPs) coated with ALD for Al2O3, focusing on their performance and the effects of clamping force. The tests involved a 12nm sample exhibiting shadowing due to a loose fit and a 6nm sample showing no deposits with a tighter fit. Cleaning results indicate variable smudging and debris levels, with imaging results on standard MCPs revealing enhanced brightness in the ALD-coated area and no degradation of image quality, apart from edge effects.

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Progress Report on ALD Coating Tests of MCPs for High-Quality Imaging Applications

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  1. SSL-UCB, ALD MCP Test Progress Sent two MCPs for Al2O3 ALD coating of half surface Both MCPs standard glass MCPs ~ 90Meg Ω

  2. SSL-UCB, ALD MCP Test Progress The two MCP assemblies were tightened differently, the 12nm sample (left) shows a shadow where the MCP was clamped in, the 6nm (right) sample shows no deposits at all. The 12nm MCP was a bit loose, and the 6nm was tight.

  3. SSL-UCB, ALD MCP Test Progress ML201-B-2 12nm ALD shows some debris and smudging that was removed in cleaning Before cleaning After cleaning

  4. SSL-UCB, ALD MCP Test Progress ML201-B-1 6nm ALD shows less debris and smudging, - was removed in cleaning Before cleaning After cleaning

  5. Initial Imaging Results on Standard MCPs with 6nm ALD coating Shows definite enhancement of brightness in ALD area No degradation of image quality, except at the boundary zone for coating 1150v MCP, 2800v Screen, UV floodPhotonis ML201-B-1 MCP, 86MΩ 1050v MCP, 2900v Screen, UV floodPhotonis ML201-B-1 MCP, 86MΩ

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