1 / 3

RICH LVL-1 problem

RICH LVL-1 problem. Almost problem comes from the Int-R chip. We have investigated the problem using a test of the Int-R chip. Dead channel Offset on the trigger output of the Int-R chip 90% of dead channel has offset(200mV) These chips should be rejected by the chip test.

hope-shelton
Télécharger la présentation

RICH LVL-1 problem

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript

  1. RICH LVL-1 problem Almost problem comes from the Int-R chip. We have investigated the problem using a test of the Int-R chip • Dead channel • Offset on the trigger output of the Int-R chip • 90% of dead channel has offset(200mV) • These chips should be rejected by the chip test. • Broken amp on the LVL-1 Board • Hot channel • Noise from the Int-R chip Int-R chip

  2. Noise • In the chip test, • Noise have seen. • 5M Hz • On the board, • There are 5 chips in one trigger channel. • If one of 5 chips has large noise, this channel has large noise. Large noise Small Noise Before change one chip After Add new condition to the chip test sequence. (Noise should be less than 10 mV.)

  3. Schedule • The Int-R chip test • Almost Done. • At least, 320 chips are needed • We have 300 chips now. • We will prepare 400 chips. • Remake AMU/ADC Board • Install good chips on the board • In Japan and BNL • Install and check boards at BNL • End of September (1 month)

More Related