70 likes | 182 Vues
Learn about the study of charge collection properties in heavily irradiated silicon using the grazing angle technique. Explore test beam comparisons and future plans regarding sensor characterization and plate properties.
E N D
Diamond detectors: a few facts, test beams and summer plans Marina Artuso Marina Artuso SU Velo Meeting
Nomenclature Top/substrate/big Bottom/growth/small Marina Artuso SU Velo Meeting
Comparison between tests @ OSU and SU Marina Artuso SU Velo Meeting
Note: –HV data should be closer to the data at OSU Note: effect of pumping? Note: more powerful source used at OSU + collimation Marina Artuso SU Velo Meeting
Study of charge collection properties The “grazing angle technique” developed to study the field/charge collection properties of heavily irradiated silicon can shed light on the charge collection/field distribution inside the diamond. An angle of 13° corresponds to 64 strips being illuminated. We can get the whole 128 strips in 2 attempts. Efficiency issue: active area 0.3X1.4 cm^2 (1/2 of normal incidence with 128 strips). Marina Artuso SU Velo Meeting
Towards the next test beam • We need to understand reason why plate 3 does not hold 1000 HV. • We need to understand properties of plate 5, could be the best candidate for next strip deposition (with SU mask) • Calculate time requirements for the normal incidence/grazing angle data to time order and prioritize Marina Artuso SU Velo Meeting
Towards the next test beam: THE WISH LIST • Complete characterization of plate 3 at normal incidence, at 500, 1000 V, both polarities. • Orient sensor at 15° with respect beam axis Marina Artuso SU Velo Meeting