300 likes | 428 Vues
This study delves into quantum transport phenomena, particularly in charging molecules during transport and through ultra-thin films. Employing the Lippmann-Schwinger method, it explores groundbreaking theoretical frameworks and experimental validations. Key findings include the observation of current suppression and subsequent increase at threshold voltages, as indicated by past studies. Collaborative insights from researchers across institutions, including Vanderbilt University and Oak Ridge National Laboratory, contribute to a comprehensive understanding of transport dynamics, offering new methods for quantifying quantum behavior in nanoscale systems.
E N D
Explorations in quantum transport – phenomena and methods Sokrates T. Pantelides Department of Physics and astronomy, Vanderbilt University, Nashville, TN and Oak Ridge National Laboratory, Oak Ridge, TN Collaborators: Yoshihiro Gohda Zhong-yi Lu Kalman Varga Supported in part by Department of Energy
Phenomena (using the Lippmann-Schwinger method) • Charging of molecules during transport (Gohda) • Transport through ultra-thin films (Lu) • New method (Varga)
t r The Lippmann-Schwinger method • Norton Lang, 1981 – • Di Ventra, Lang, and Pantelides, 2000-2002
Theory 0° 90° 0° 90° Experiment: Reed et al (2000) T=190 K T=300 K
Nature 417, 72 (2002) “The current is strongly suppressed up to a threshold V, then it increases in steps”
Coulomb blockade in a quantum dot GaAs-AlGaAs-InGaAs-AlGaAs-GaAs
LUMO LUMO V=2.4V
V=3.6[V] V=1.2[V]
LUMO LUMO AFTER SELF-CONSISTENCY, MOLECULE IS NEUTRAL! ELECTRODES ARE NEUTRAL! EXCITED STATE?
C6H4(NO2)S ELIMINATE CONTACT ON LEFT C6H5S
-3 -2 -1 0 1 -6 -4 -2 0 2 Energy (eV) Energy (eV) C6H5-S C6H4(NO2)-S
4.2V 1 e 1.8V 1 e 0.6V 0 e
0.8 1.2 0.3 dQ=0 Using a gate voltage Vsd = 0.1 V
Fowler-Nordheim tunneling M O S J E Ec Ev n-Si EF Metal SiO2 J/E2 = Aexp(-B/E)
J/E2 = Aexp(-B/E) ln(J/E2) 1/E Fowler-Nordheim I I=V/R V Ohmic
8-layer Si(001) Ohmic
Effective potential 8 layers Si(001) V=0.1v EF EF J V=1.0v V=5.0v The dash-dot lines are boundary
Current vs thickness [Si(001)] Bias=1.0V
I-V curve through SiO2 nano-film • Three regions: • 0.0 to 0.5V quasi-linear; • 0.5 to 4.0V non-linear; • Over 4.0V quasi-linear
Effective potential nano-film SiO2 J EF V=0.5v V= 4.0v The dash-dot lines are boundary
1.2 n m (SiO2) 1.5 n m (SiO2) 0.9 n m (vacuum) 1.2 n m (vacuum) 1.5 n m (vacuum) 0 1 2 3 4 5 G. Timp et al (Bell Lab) 1998 calculation
t r EVERYWHERE The Lippmann-Schwinger method
Static external potential DENSITY FUNCTIONAL THEORY FOR STEADY-STATE TRANSPORT (CURRENT-DENSITY FUNCTIONAL) + B.C.
Sink Source Schrödinger equation with imaginary potential: MAP TRANSPORT ONTO AN EIGENVALUE PROBLEM Battery!
Na wire Real-space DFT calculation Jellium electrodes Bias Voltage
Benzene ring -- IV characteristics Experiment (Reed et al.)