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This workshop focuses on innovative methodologies for patent classification and competitive intelligence analysis. Participants will explore various techniques such as co-citation analysis, LDA topic modeling, EM clustering, and k-means algorithms. We will address challenges in co-word analysis and discuss the limitations of traditional patent classification methods (WIPO, Derwent, OECD) in reflecting actual industry standards. Join us to discover effective approaches for patent data validation and identify the best classification methods for robust patent analysis.
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Own research related to workshop • Patent competitive intelligence analysis • Patent classification for competitiveness analysis through: • Co-citation analysis • LDA topic model • EM cluster • k-means algorithm • Co-word analysis
Challenge • Patent classification do not correspondent with industry • WIPO——IPC • Derwent——MC • … • OECD——ISIC • Differences between classification methods • Which is better for patent analysis • How can we explore an non-expert validation • Patent data source • USPTO(NEBR—update?) • Derwent(expensive) • SIPO(non-standard、no citation info.) • ……
Bo Wang Wiselab, Dalian university of technology bowang1121@gmail.com