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Dynamic Memory Failure Pattern Dictionary for Memory Diagnosis

This document presents a comprehensive Dynamic Memory Failure Pattern Dictionary developed by the Laboratory of Reliable Computing at the National Tsing Hua University. It focuses on various defect patterns in memory systems, including both single and multiple defect failure patterns (MDFP). The dictionary is essential for systematic failure analysis of memory components, especially in real industrial test data, addressing issues caused by process variations. The work is grounded in traditional patterns and enhances diagnosis frameworks by incorporating new failure classifications.

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Dynamic Memory Failure Pattern Dictionary for Memory Diagnosis

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  1. Dynamic Memory Failure Pattern Dictionary for Memory Diagnosis Laboratory of Reliable Computing Department of Electrical Engineering National Tsing Hua University Hsinchu, Taiwan

  2. Dynamic Defect Dictionary • Traditional Memory Failure Pattern • Considers single defect • Systematic Failure Analysis • Considers systematic defects • Considers Multiple-Defect Failure-Pattern (MDFP) • Critical in real industrial test data • Maybe caused by process variation • Based on Single-Defect Failure-Pattern (SDFP) • Construct MDFP by SDFPs

  3. Defect Dictionary SAF1 SAF0 RandomFault Ref: Wu, et al., ITC, 2003

  4. Defect Dictionary SAF1 SAF0 RandomFault Ref: Wu, et al., ITC, 2003

  5. Defect Dictionary SAF1 SAF0 RandomFault Ref: Wu, et al., ITC, 2003

  6. Constraint • New failure pattern • Defect suspects g1/2/3/4 + g1/2/3/4 BL0 BL1 BL0 BL1 h1/2 + h1/2 WL0 VDD VDD i1/2/3/4 + i1/2/3/4 j1/2/3/4 + j1/2/3/4 WL1 VDD VDD

  7. Systematic Failure • New failure pattern • Defect suspects ‧‧‧‧‧‧ j1/2/3/4+‧‧‧‧+j1/2/3/4 BL254 BL0 BL254 BL0 BL1 BL1 BL5 WL0 WL0 ‧‧‧‧‧‧ g1/2/3/4+‧‧‧‧+g1/2/3/4 VDD VDD VDD VDD BL255 WL1 WL1 VDD VDD VDD VDD ‧‧‧‧‧‧

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