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The presentation outlines modifications to carbon black processing methods for elastomers, focusing on cost-effectiveness, elongation, response time, and precision. It details improved mixing techniques, surface area enhancement, and future process enhancements. The final design involves strain monitoring using advanced sensor setups with Arduino and data processing for resistance monitoring. The presentation also discusses conductive composite conduction modeling, LabView program implementation, and porosity characterization.
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Prototype Presentation Stephanie Moran, Ryan Rosario, Zachary Stauber, Bethany Tomerlin, Juan Carlos Ybarra
We modified our goals to more suitably match our application Inexpensive High Elongation (>10%) Fast Response Time Precision
Current Improved Processing Setup Weighing Carbon Black Increased Mixing Time Using Katjen Carbon Black Increased Surface area: 1400 m2/g Typical Carbon Black is 100-500 m2/g
Future Improvements to Processing Moving to a Silcone Rubber - 20:1 Mixing Ratio -Increase mixing Time Purchasing A Dispersion Blade Placing Samples Under Hot Press to Cure
Four-point resistance measurements eliminate errors due to changing contact resistance.
An automatic data acquisition setup allows for a faster sample rate. Strain vs. Time Voltage Output Multimeter Multimeter Resistance Output
Sensor Arrangement and Data Processing Final Design: • Output: • Resistance vs. Strain • Position of sensor Bread Board Arduino Multiplexer Amp MC
Requirements for Final Design • Glove Requirements: • Flexible • Relatively rigid substrate for strain measurement • Sensor Requirements: • Thinner • More elastic at higher strain rates • Possible Solutions: • Integrating sensor into fabric of glove • Create a glove with selective rigid sections • Molds with depth much smaller than those being used • Cut samples with proper shape. MC
Conduction in the composite cannot be explained by tunneling, but can be modeled by Mean Field Theory. e- e- 30nm
Porosity Characterization of Carbon Filled Elastomers 10X 200X MC Voids Seen Under Confocal Microscope