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Powering tests

Powering tests. Laura Gonella Physikalisches Institut Uni Bonn. Powering configurations. Meaurements. For different powering configuration, measure. PrmpVbp, PrmpVbp_L/R. For now done on bare chips. Current PCB does not have circuitry for sensor HV. 43.

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Powering tests

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  1. Powering tests Laura Gonella Physikalisches Institut Uni Bonn

  2. Powering configurations L. Gonella - Powering tests

  3. Meaurements • For different powering configuration, measure PrmpVbp, PrmpVbp_L/R For now done on bare chips. Current PCB does not have circuitry for sensor HV. 43 VDDA2M is not connected on the PCB. It was removed to make space for regulator testing circuitry. Wire bond from VDDA pad to measurement point. Same for VDDD. L. Gonella - Powering tests

  4. Setup • Power is provided via an independent power supply • Either to VDDD and VDDA directly or to the input of the regulators • USBpix is used only to send/receive signals to/from the chip • Stcontrol • Standard configuration file • Top row not powered • DC1 and DC40 disabled L. Gonella - Powering tests

  5. Direct powering configuration 1 (DP1) L. Gonella - Powering tests

  6. Direct powering configuration 1 (DP1) Rwb Rwire Rpcb 1.5V Rwire Rpcb 1.2V Rwb L. Gonella - Powering tests

  7. Voltages and currents • Ra = 0.157Ohm • Rd = 0.265Ohm L. Gonella - Powering tests

  8. Threshold scan L. Gonella - Powering tests

  9. Threshold scan – PrmpVbp*2 L. Gonella - Powering tests

  10. Direct powering configuration 2 (DP2) L. Gonella - Powering tests

  11. Direct powering configuration 2 (DP2) • VDDD and VDDA shorted at supply • Same Rwire, Rpcb, Rwb as in the previous measurement • Use calculated Ra and Rd to extimate analog and digital current Rwb Rwire Rpcb 1.5V Rpcb Rwire Rwb L. Gonella - Powering tests

  12. Voltages and currents • The analog current should increase of 100mA when PrmpVbp = 86, the digital current should stay the same • The analog current increases of 70mA • The digital current decreases of 60mA ??? L. Gonella - Powering tests

  13. Threshold scan L. Gonella - Powering tests

  14. Threshold scan – PrmpVbp*2 L. Gonella - Powering tests

  15. Regulator configuration 1 (Reg1) L. Gonella - Powering tests

  16. Regulator configuration 1 (Reg1) 0.01Ω 0.01Ω L. Gonella - Powering tests

  17. Power up - Voltage • Vin is the voltage at the power supply • Vin Reg1, Vin Reg2, VDDD, VDDA are measured at the pad • Wire bond from the pad to a measurement point L. Gonella - Powering tests

  18. Power up - Current • Iin is the current measured at the power supply, i.e. total current flowing to the chip VDDD regulated VDDA regulated L. Gonella - Powering tests

  19. Voltages and currents • Ia, Id measured as a Vdrop across a R=10mOhm • Ia + Id > Iin ???? • (*) Vref1 = 0.730V, increased to 0.750V after loading the std cfg L. Gonella - Powering tests

  20. Threshold scan L. Gonella - Powering tests

  21. Threshold scan – PrmpVbp*2 L. Gonella - Powering tests

  22. Regulator configuration 1 (Reg2) L. Gonella - Powering tests

  23. Regulator configuration 1 (Reg1) Vref = 0.740V 0.01Ω Vref = 0.740V 0.01Ω L. Gonella - Powering tests

  24. Power up - Voltage • Vin is the voltage at the power supply • Vin Reg1, Vin Reg2, VDDA are measured at the pad • Wire bond from the pad to a measurement point L. Gonella - Powering tests

  25. Power up - Current • Iin is the current measured at the power supply, i.e. total current flowing to the chip VDDA regulated L. Gonella - Powering tests

  26. Voltages and currents L. Gonella - Powering tests

  27. Threshold scan L. Gonella - Powering tests

  28. Threshold scan – PrmpVbp*2 L. Gonella - Powering tests

  29. Vref mismatch • Vref1 = 0.740V L. Gonella - Powering tests

  30. Summary table L. Gonella - Powering tests

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