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From research at Intel Corporation, DARPA, and DTO emerges a revolutionary concept in computing - Paintable Computing to Scale-Free Architectures. This innovative approach introduces new reliability challenges, soft error management, and robustness in extreme device variations. With a focus on scalability and meshed architectures, it promises smoother performance scaling and efficient code execution across various platforms. Dive into the future of computing with this ground-breaking solution.
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From Paintable ComputingtoScale-free Architectures Bill Butera Digital Enterprise Group Intel Corporation
Paint Research, DARPA, DTO first HW Concept SWProof-of-concept Simulation ‘COTS’ HW
Wider Extreme device variations Soft Error FIT/Chip (Logic & Mem) Burn-in may phase out…? Time dependent device degradation Reliability – new challenges at extreme of device shrinkage Source: Shekhar Borkar- Intel CTG
Scale-free Architectures • SW techniques for reliable computation on meshes of unreliable HW nodes • High value “statistical workloads” running reliably on meshes of unreliable cores (nodes) • HW meshes whose performance scale smoothly with size -- over multiple orders of magnitude(1K nodes upward) • “Write once”, scale-agnostic application code • Excessive defect tolerance, smooth response to soft error. • Shortened HW design cycle, minimum form factor, faster yield ramps. Farm (300K nodes) Server (50K) Desktop (20K) UMPC (2K) Cell phone (1K) All platforms with the same short design cycle