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FPIX1 Calibration at SU

FPIX1 Calibration at SU. Marina Artuso Jianchun Wang Syracuse University 10/02/2000. Test Setup. col: 10 row: 10. Efficiency. V 0 = 80.86 mV s = 0.73 mV. V pulse (mV). Efficiency Distribution. Capacity: 6 f F (37.5 e / mV) Threshold: 3032 e Noise: 27 e.

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FPIX1 Calibration at SU

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  1. FPIX1 Calibration at SU Marina Artuso Jianchun Wang Syracuse University 10/02/2000

  2. Test Setup Jianchun (JC) Wang

  3. col: 10 row: 10 Efficiency V0 = 80.86 mV s = 0.73 mV Vpulse (mV) Efficiency Distribution Capacity: 6 f F (37.5 e / mV) Threshold: 3032 e Noise: 27 e Jianchun (JC) Wang

  4. Mean = 3134 e Width = 292 e Threshold 0 ( 1000 e) Threshold • 15  87 cells tested (row: 0-86, col: 3-17) • Voltage scan step: 0.5 mV • 25 events per point Jianchun (JC) Wang

  5. Threshold Charge ( x 1000 e) Threshold Voltage (V) Threshold FIT: Charge (ke) = - 17.19  ( V - 2.366 ) Jianchun (JC) Wang

  6. Mean = 26.6 Sigma = 3.1 Noise ( electrons ) Noise • Only threshold 0 studied • Fine step: 0.175 mV • 100 events per point Jianchun (JC) Wang

  7. Summary • Threshold and noise measured, consistent with measurements at Fermilab • The system works fine with FPIX1 readout chip • The boards are being adapted to FPIX0 readout chip • X-ray source calibration will be performed on FPIX0 attached to ATLAS sensor Jianchun (JC) Wang

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