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This presentation by Balaji Krishnapuram and collaborators discusses the shortcomings of traditional classifiers, which rely on the IID (Independent and Identically Distributed) assumption, often invalid in real-world scenarios like Computer-Aided Diagnosis (CAD). The outline includes convex algorithms for Multiple Instance Learning (MIL), Bayesian methods for batch classification, and advancements in handling correlated data. The work emphasizes the need for models that consider correlations within datasets, particularly in medical diagnostics, to improve performance in detecting conditions like early-stage colon cancer and pulmonary embolisms.
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Learning Classifiers For Non-IID Data Balaji Krishnapuram, Computer-Aided Diagnosis and Therapy Siemens Medical Solutions, Inc. Collaborators: Volkan Vural, Jennifer Dy [North Eastern], Ya Xue [Duke], Murat Dundar, Glenn Fung, Bharat Rao [Siemens] Jun 27, 2006
Outline • Implicit IID assumption in traditional classifier design • Often, not valid in real life. Motivating CAD problems • Convex algorithms for Multiple Instance Learning (MIL) • Bayesian algorithms for Batch-wise classification • Faster, approximate algorithms via mathematical programming • Summary / Conclusions
IID assumption in classifier design • Training data D={(xi,yi)i=1N: xi2 Rd, yi2 {+1,-1}}, • Testing data T ={(xi,yi)i=1M: xi2 Rd, yi2 {+1,-1}}, • Assume each training/testing sample drawn independently from identical distribution: (xi,yi) ~ PXY(x,y) • This is why we can classify one test sample at a time, ignoring the features of the other test samples • Eg. Logistic Regression: P(yi=1|xi,w)=1/(1+exp(-wT xi))
Evaluating classifiers: learning-theory • Binomial test set bounds: With high probability over the random draw of M samples in testing set T, • if M large and a classifier w is observed to be accurate on T, • with high probability its expected accuracy over a random draw of a sample from PXY(x,y) will be high • If the IID assumption fails, all bets are off ! • Thought experiment: repeat same test sample M times
Training classifiers: learning theory • With high probability over the random draw of N samples in training set D, the expected accuracy on a random sample from PXY(x,y) for the learnt classifier w will be high iff • accurate on the training set D; and N large • satisfies intuition before seeing data (“prior”, large margin etc) • PAC-Bayes, VC-theory etc rely on iid assumption • Relaxation to exchangeability being explored
Additive Random Effect Models • The classification is treated as iid, but only if given both • Fixed effects (unique to sample) • Random effects (shared among samples) • Simple additive model to explain the correlations • P(yi|xi,w,ri,v)=1/(1+exp(-wT xi–vT ri)) • P(yi|xi,w,ri)=s P(yi|xi,w,ri,v) p(v|D) dv • Sharing vT ri among many samples correlated prediction • …But only small improvements in real-life applications
Candidate Specific Random Effects Model: Polyps Sensitivity Specificity
CAD algorithms: domain-specific issues • Multiple (correlated) views: one detection is sufficient • Systemic treatment of diseases: e.g. detecting one PE sufficient • Modeling the data acquisition mechanism • Errors in guessing class labels for training set.
The Multiple Instance Learning Problem • A bag is a collection of many instances (samples) • The class label is provided for bags, not instances • Positive bag has at least one +ve instance in it • Examples of “bag” definition for CAD applications: • Bag=samples from multiple views, for the same region • Bag=all candidates referring to same underlying structure • Bag=all candidates from a patient
CH-MIL Algorithm for Fisher’s Discriminant • Easy implementation via Alternating Optimization • Scales well to very large datasets • Convex problem with unique optima
Lung CAD *Pending FDA Approval AX Computed Tomography Lung Nodules& Pulmonary Emboli DR CAD
Classifying a Correlated Batch of Samples • Let classification of individual samples xi be based on ui • Eg. Linear ui = wT xi ; or kernel-predictor ui= j=1Nj k(xi,xj) • Instead of basing the classification on ui, we will base it on an unobserved (latent) random variable zi • Prior: Even before observing any features xi (thus before ui), zi are known to be correlated a-priori, • p(z)=N(z|0,) • Eg. due to spatial adjacency = exp(-D), • Matrix D=pair-wise dist. between samples
Classifying a Correlated Batch of Samples • Prior: Even before observing any features xi (thus before ui), zi are known to be correlated a-priori, • p(z)=N(z|0,) • Likelihood: Let us claim that ui is really a noisy observation of a random variable zi : • p(ui|zi)=N(ui|zi, 2) • Posterior: remains correlated, even after observing the features xi • P(z|u)=N(z|(-12+I)-1u, (-1+2I)-1) • Intuition: E[zi]=j=1N Aij uj ; A=(-12+I)-1
SVM-like Approximate Algorithm • Intuition: classify using E[zi]=j=1N Aij uj ; A=(-12+I)-1 • What if we used A=( + I) instead? • Reduces computation by avoiding inversion. • Not principled, but a heuristic for speed. • Yields an SVM-like mathematical programming algorithm:
Conclusions • IID assumption is universal in ML • Often violated in real life, but ignored • Explicit modeling can substantially improve accuracy • Described 3 models in this talk, utilizing varying levels of information • Additive Random Effects Models: weak correlation information • Multiple Instance Learning: stronger correlations enforced • Batch-wise classification models: explicit information • Statistically significant improvement in accuracy • Only starting to scratch the surface, lots to improve!